Diode structures from amorphous low-temperature GaAs
Effect of annealing on electrical properties of GaAs diode structure that incorporates a nominally undoped LT layer on top of conventionally grown p-type GaAs is examined. Unannealed GaAs grown by MBE at substrate temps. < 250 degrees C is amorphous and highly resistive. Annealing at high temps....
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Veröffentlicht in: | Journal of Electronic Materials 1993-12, Vol.22 (12), p.1437-1440 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | Effect of annealing on electrical properties of GaAs diode structure that incorporates a nominally undoped LT layer on top of conventionally grown p-type GaAs is examined. Unannealed GaAs grown by MBE at substrate temps. < 250 degrees C is amorphous and highly resistive. Annealing at high temps. converts undoped LT GaAs from amorphous to single-crystal material. Annealed material is n-type. c-v characteristics of LT on p-type GaAs structures shows greater symmetry, with lower reverse leakage currents, as anneal temp. is increased to > 400 degrees . This reflects improved crystal quality of the LT layer. |
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ISSN: | 0361-5235 1543-186X |
DOI: | 10.1007/BF02649994 |