Diode structures from amorphous low-temperature GaAs

Effect of annealing on electrical properties of GaAs diode structure that incorporates a nominally undoped LT layer on top of conventionally grown p-type GaAs is examined. Unannealed GaAs grown by MBE at substrate temps. < 250 degrees C is amorphous and highly resistive. Annealing at high temps....

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Veröffentlicht in:Journal of Electronic Materials 1993-12, Vol.22 (12), p.1437-1440
Hauptverfasser: Kyono, C. S., Tadayon, B., Twigg, M. E., Giordana, A., Simons, D. S., Fatemi, M., Tadayon, S.
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Sprache:eng
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Zusammenfassung:Effect of annealing on electrical properties of GaAs diode structure that incorporates a nominally undoped LT layer on top of conventionally grown p-type GaAs is examined. Unannealed GaAs grown by MBE at substrate temps. < 250 degrees C is amorphous and highly resistive. Annealing at high temps. converts undoped LT GaAs from amorphous to single-crystal material. Annealed material is n-type. c-v characteristics of LT on p-type GaAs structures shows greater symmetry, with lower reverse leakage currents, as anneal temp. is increased to > 400 degrees . This reflects improved crystal quality of the LT layer.
ISSN:0361-5235
1543-186X
DOI:10.1007/BF02649994