A simple technique for the measurement of dendritic growth rates in undercooled metallic melts and its application to Ni and Ti

The technique is based on the detection of the recalescence at two opposite points on the surface of a levitated melt by means of photo-diodes. Nucleation is externally triggered within the field of view of one detector, so that the dendritic growth rate is given by dividing the specimen diameter by...

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Veröffentlicht in:Materials science & engineering. A, Structural materials : properties, microstructure and processing Structural materials : properties, microstructure and processing, 1995-11, Vol.203 (1), p.197-202
Hauptverfasser: Walder, S., Ryder, P.L.
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Sprache:eng
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