Characterization of radiative surface modes and anisotropy in Ag /SiO sub 2 multilayers, by visible and ir ellipsometry

Characterization of radiative surface modes and anisotropy in Ag /SiO sub 2 multilayers, by visible and ir ellipsometry

Ellipsometric measurements in the visible (1.4-5.4 eV) and the ir (0.03-0.5 eV) are performed on metal/dielectric (Ag/SiO sub 2 ) periodic multilayer prepared by magnetron sputtering. Results are discussed in terms of radiative modes occurring at the plasma frequency of the metal (3.78 eV) and at th...

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Veröffentlicht in:Thin solid films 1993-01, Vol.234 (1-2), p.496-499
Hauptverfasser: Bichri, A, Hunderi, O, Lafait, J, Wold, E
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container_title Thin solid films
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creator Bichri, A
Hunderi, O
Lafait, J
Wold, E
description Ellipsometric measurements in the visible (1.4-5.4 eV) and the ir (0.03-0.5 eV) are performed on metal/dielectric (Ag/SiO sub 2 ) periodic multilayer prepared by magnetron sputtering. Results are discussed in terms of radiative modes occurring at the plasma frequency of the metal (3.78 eV) and at the longitudinal optical (0.154 eV) and transverse optical (0.133 eV) frequencies of the dielectric.
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title Characterization of radiative surface modes and anisotropy in Ag /SiO sub 2 multilayers, by visible and ir ellipsometry
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