Architectural power analysis: The dual bit type method
This paper describes a novel strategy for generating accurate black-box models of datapath power consumption at the architecture level. This is achieved by recognizing that power consumption in digital circuits is affected by activity, as well as physical capacitance. Since existing strategies chara...
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Veröffentlicht in: | IEEE transactions on very large scale integration (VLSI) systems 1995-06, Vol.3 (2), p.173-187 |
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description | This paper describes a novel strategy for generating accurate black-box models of datapath power consumption at the architecture level. This is achieved by recognizing that power consumption in digital circuits is affected by activity, as well as physical capacitance. Since existing strategies characterize modules for purely random inputs, they fail to account for the effect of signal statistics on switching activity. The dual bit type (DBT) model, however, accounts not only for the random activity of the least significant bits (LSB's), but also for the correlated activity of the most significant bits (MSB's), which contain two's-complement sign information. The resulting model is parameterizable in terms of complexity factors such as word length and can be applied to a wide variety of modules ranging from adders, shifters, and multipliers to register files and memories. Since the model operates at the register transfer level (RTL), it is orders of magnitude faster than gate- or circuit-level tools, but while other architecture-level techniques often err by 50-100% or more, the DBT method offers error rates on the order of 10-15%.< > |
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This is achieved by recognizing that power consumption in digital circuits is affected by activity, as well as physical capacitance. Since existing strategies characterize modules for purely random inputs, they fail to account for the effect of signal statistics on switching activity. The dual bit type (DBT) model, however, accounts not only for the random activity of the least significant bits (LSB's), but also for the correlated activity of the most significant bits (MSB's), which contain two's-complement sign information. The resulting model is parameterizable in terms of complexity factors such as word length and can be applied to a wide variety of modules ranging from adders, shifters, and multipliers to register files and memories. Since the model operates at the register transfer level (RTL), it is orders of magnitude faster than gate- or circuit-level tools, but while other architecture-level techniques often err by 50-100% or more, the DBT method offers error rates on the order of 10-15%.< ></description><identifier>ISSN: 1063-8210</identifier><identifier>EISSN: 1557-9999</identifier><identifier>DOI: 10.1109/92.386219</identifier><identifier>CODEN: IEVSE9</identifier><language>eng</language><publisher>IEEE</publisher><subject>Capacitance ; Circuits ; Delay estimation ; Energy consumption ; Power generation ; Power system modeling ; Process design ; Registers ; Semiconductor device modeling ; Very large scale integration</subject><ispartof>IEEE transactions on very large scale integration (VLSI) systems, 1995-06, Vol.3 (2), p.173-187</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c308t-f9bab2bf2f8b9e0a37f0b72b5461dcd0eddfbaf275176a6d9d12fd57b80df2893</citedby><cites>FETCH-LOGICAL-c308t-f9bab2bf2f8b9e0a37f0b72b5461dcd0eddfbaf275176a6d9d12fd57b80df2893</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/386219$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,796,27924,27925,54758</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/386219$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Landman, P.E.</creatorcontrib><creatorcontrib>Rabaey, J.M.</creatorcontrib><title>Architectural power analysis: The dual bit type method</title><title>IEEE transactions on very large scale integration (VLSI) systems</title><addtitle>TVLSI</addtitle><description>This paper describes a novel strategy for generating accurate black-box models of datapath power consumption at the architecture level. This is achieved by recognizing that power consumption in digital circuits is affected by activity, as well as physical capacitance. Since existing strategies characterize modules for purely random inputs, they fail to account for the effect of signal statistics on switching activity. The dual bit type (DBT) model, however, accounts not only for the random activity of the least significant bits (LSB's), but also for the correlated activity of the most significant bits (MSB's), which contain two's-complement sign information. The resulting model is parameterizable in terms of complexity factors such as word length and can be applied to a wide variety of modules ranging from adders, shifters, and multipliers to register files and memories. Since the model operates at the register transfer level (RTL), it is orders of magnitude faster than gate- or circuit-level tools, but while other architecture-level techniques often err by 50-100% or more, the DBT method offers error rates on the order of 10-15%.< ></description><subject>Capacitance</subject><subject>Circuits</subject><subject>Delay estimation</subject><subject>Energy consumption</subject><subject>Power generation</subject><subject>Power system modeling</subject><subject>Process design</subject><subject>Registers</subject><subject>Semiconductor device modeling</subject><subject>Very large scale integration</subject><issn>1063-8210</issn><issn>1557-9999</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1995</creationdate><recordtype>article</recordtype><recordid>eNqN0D1PwzAQBmALgUQpDKxMmZAYUs527dhsFeJLqsRSZsuOz2pQ2gTbEeq_JygVM7fcSe-jG15CriksKAV9r9mCK8moPiEzKkRV6nFOxxskLxWjcE4uUvoEoMulhhmRq1hvm4x1HqJti777xljYvW0PqUkPxWaLhR_GwDW5yIceix3mbecvyVmwbcKr456Tj-enzeNruX5_eXtcrcuag8pl0M465gILymkEy6sArmJOLCX1tQf0PjgbWCVoJa302lMWvKicAh-Y0nxObqe_fey-BkzZ7JpUY9vaPXZDMkwJqQT7BxRacOB0hHcTrGOXUsRg-tjsbDwYCua3QqOZmSoc7c1kG0T8c8fwB8Iqa7g</recordid><startdate>19950601</startdate><enddate>19950601</enddate><creator>Landman, P.E.</creator><creator>Rabaey, J.M.</creator><general>IEEE</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SC</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>JQ2</scope><scope>L7M</scope><scope>L~C</scope><scope>L~D</scope></search><sort><creationdate>19950601</creationdate><title>Architectural power analysis: The dual bit type method</title><author>Landman, P.E. ; Rabaey, J.M.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c308t-f9bab2bf2f8b9e0a37f0b72b5461dcd0eddfbaf275176a6d9d12fd57b80df2893</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1995</creationdate><topic>Capacitance</topic><topic>Circuits</topic><topic>Delay estimation</topic><topic>Energy consumption</topic><topic>Power generation</topic><topic>Power system modeling</topic><topic>Process design</topic><topic>Registers</topic><topic>Semiconductor device modeling</topic><topic>Very large scale integration</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Landman, P.E.</creatorcontrib><creatorcontrib>Rabaey, J.M.</creatorcontrib><collection>CrossRef</collection><collection>Computer and Information Systems Abstracts</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>ProQuest Computer Science Collection</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Computer and Information Systems Abstracts Academic</collection><collection>Computer and Information Systems Abstracts Professional</collection><jtitle>IEEE transactions on very large scale integration (VLSI) systems</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Landman, P.E.</au><au>Rabaey, J.M.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Architectural power analysis: The dual bit type method</atitle><jtitle>IEEE transactions on very large scale integration (VLSI) systems</jtitle><stitle>TVLSI</stitle><date>1995-06-01</date><risdate>1995</risdate><volume>3</volume><issue>2</issue><spage>173</spage><epage>187</epage><pages>173-187</pages><issn>1063-8210</issn><eissn>1557-9999</eissn><coden>IEVSE9</coden><abstract>This paper describes a novel strategy for generating accurate black-box models of datapath power consumption at the architecture level. This is achieved by recognizing that power consumption in digital circuits is affected by activity, as well as physical capacitance. Since existing strategies characterize modules for purely random inputs, they fail to account for the effect of signal statistics on switching activity. The dual bit type (DBT) model, however, accounts not only for the random activity of the least significant bits (LSB's), but also for the correlated activity of the most significant bits (MSB's), which contain two's-complement sign information. The resulting model is parameterizable in terms of complexity factors such as word length and can be applied to a wide variety of modules ranging from adders, shifters, and multipliers to register files and memories. Since the model operates at the register transfer level (RTL), it is orders of magnitude faster than gate- or circuit-level tools, but while other architecture-level techniques often err by 50-100% or more, the DBT method offers error rates on the order of 10-15%.< ></abstract><pub>IEEE</pub><doi>10.1109/92.386219</doi><tpages>15</tpages></addata></record> |
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subjects | Capacitance Circuits Delay estimation Energy consumption Power generation Power system modeling Process design Registers Semiconductor device modeling Very large scale integration |
title | Architectural power analysis: The dual bit type method |
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