Visible light emission from a porous silicon/solution diode

Reduction of S2O82− ions at the interface between an n-type porous Si electrode and an aqueous solution gives rise to electroluminescence showing evidence of quantization effects. A broad emission band with a maximum at 670 nm is observed similar to the photoluminescence spectrum of the same layers....

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Veröffentlicht in:Applied physics letters 1992-07, Vol.61 (1), p.108-110
Hauptverfasser: BRESSERS, P. M. M. C, KNAPEN, J. W. J, MEULENKAMP, E. A, KELLY, J. J
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container_start_page 108
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container_volume 61
creator BRESSERS, P. M. M. C
KNAPEN, J. W. J
MEULENKAMP, E. A
KELLY, J. J
description Reduction of S2O82− ions at the interface between an n-type porous Si electrode and an aqueous solution gives rise to electroluminescence showing evidence of quantization effects. A broad emission band with a maximum at 670 nm is observed similar to the photoluminescence spectrum of the same layers. The results suggest that holes are ‘‘injected’’ into the valence band of the porous semiconductor from an intermediate of the reduction reaction, the SO4−⋅ radical ion. The resulting electron-hole recombination is responsible for the visible light emission.
doi_str_mv 10.1063/1.108470
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fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_25940304</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>25940304</sourcerecordid><originalsourceid>FETCH-LOGICAL-c385t-5a85dc214539c2db13ba6ca6619801dfd82ad08840e4da2d8e2c055ab295a2813</originalsourceid><addsrcrecordid>eNo9kE9LxDAUxIMouK6CH6EHES9130uaboonWfwHC17Ua0iTVCPZZs3rHvz2duniaRjmxzAMY5cItwi1WOAoqlrCEZshLJelQFTHbAYAoqwbiafsjOh7tJILMWN3H4FCG30Rw-fXUPhNIAqpL7qcNoUptimnHRUUYrCpX1CKu2Efu5CcP2cnnYnkLw46Z--PD2-r53L9-vSyul-XVig5lNIo6SzHSorGcteiaE1tTV1jowBd5xQ3DpSqwFfOcKc8tyClaXkjDVco5ux66t3m9LPzNOhxpfUxmt6P6zSXTQUCqhG8mUCbE1H2nd7msDH5VyPo_Tsa9fTOiF4dOg1ZE7tsehvon5dVjUJI8QfvgmKb</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>25940304</pqid></control><display><type>article</type><title>Visible light emission from a porous silicon/solution diode</title><source>AIP Digital Archive</source><creator>BRESSERS, P. M. M. C ; KNAPEN, J. W. J ; MEULENKAMP, E. A ; KELLY, J. J</creator><creatorcontrib>BRESSERS, P. M. M. C ; KNAPEN, J. W. J ; MEULENKAMP, E. A ; KELLY, J. J</creatorcontrib><description>Reduction of S2O82− ions at the interface between an n-type porous Si electrode and an aqueous solution gives rise to electroluminescence showing evidence of quantization effects. A broad emission band with a maximum at 670 nm is observed similar to the photoluminescence spectrum of the same layers. The results suggest that holes are ‘‘injected’’ into the valence band of the porous semiconductor from an intermediate of the reduction reaction, the SO4−⋅ radical ion. The resulting electron-hole recombination is responsible for the visible light emission.</description><identifier>ISSN: 0003-6951</identifier><identifier>EISSN: 1077-3118</identifier><identifier>DOI: 10.1063/1.108470</identifier><identifier>CODEN: APPLAB</identifier><language>eng</language><publisher>Melville, NY: American Institute of Physics</publisher><subject>Chemistry ; Electrochemistry ; Exact sciences and technology ; General and physical chemistry ; Kinetics and mechanism of reactions</subject><ispartof>Applied physics letters, 1992-07, Vol.61 (1), p.108-110</ispartof><rights>1992 INIST-CNRS</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c385t-5a85dc214539c2db13ba6ca6619801dfd82ad08840e4da2d8e2c055ab295a2813</citedby><cites>FETCH-LOGICAL-c385t-5a85dc214539c2db13ba6ca6619801dfd82ad08840e4da2d8e2c055ab295a2813</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,27901,27902</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&amp;idt=5461335$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>BRESSERS, P. M. M. C</creatorcontrib><creatorcontrib>KNAPEN, J. W. J</creatorcontrib><creatorcontrib>MEULENKAMP, E. A</creatorcontrib><creatorcontrib>KELLY, J. J</creatorcontrib><title>Visible light emission from a porous silicon/solution diode</title><title>Applied physics letters</title><description>Reduction of S2O82− ions at the interface between an n-type porous Si electrode and an aqueous solution gives rise to electroluminescence showing evidence of quantization effects. A broad emission band with a maximum at 670 nm is observed similar to the photoluminescence spectrum of the same layers. The results suggest that holes are ‘‘injected’’ into the valence band of the porous semiconductor from an intermediate of the reduction reaction, the SO4−⋅ radical ion. The resulting electron-hole recombination is responsible for the visible light emission.</description><subject>Chemistry</subject><subject>Electrochemistry</subject><subject>Exact sciences and technology</subject><subject>General and physical chemistry</subject><subject>Kinetics and mechanism of reactions</subject><issn>0003-6951</issn><issn>1077-3118</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1992</creationdate><recordtype>article</recordtype><recordid>eNo9kE9LxDAUxIMouK6CH6EHES9130uaboonWfwHC17Ua0iTVCPZZs3rHvz2duniaRjmxzAMY5cItwi1WOAoqlrCEZshLJelQFTHbAYAoqwbiafsjOh7tJILMWN3H4FCG30Rw-fXUPhNIAqpL7qcNoUptimnHRUUYrCpX1CKu2Efu5CcP2cnnYnkLw46Z--PD2-r53L9-vSyul-XVig5lNIo6SzHSorGcteiaE1tTV1jowBd5xQ3DpSqwFfOcKc8tyClaXkjDVco5ux66t3m9LPzNOhxpfUxmt6P6zSXTQUCqhG8mUCbE1H2nd7msDH5VyPo_Tsa9fTOiF4dOg1ZE7tsehvon5dVjUJI8QfvgmKb</recordid><startdate>19920706</startdate><enddate>19920706</enddate><creator>BRESSERS, P. M. M. C</creator><creator>KNAPEN, J. W. J</creator><creator>MEULENKAMP, E. A</creator><creator>KELLY, J. J</creator><general>American Institute of Physics</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope></search><sort><creationdate>19920706</creationdate><title>Visible light emission from a porous silicon/solution diode</title><author>BRESSERS, P. M. M. C ; KNAPEN, J. W. J ; MEULENKAMP, E. A ; KELLY, J. J</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c385t-5a85dc214539c2db13ba6ca6619801dfd82ad08840e4da2d8e2c055ab295a2813</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1992</creationdate><topic>Chemistry</topic><topic>Electrochemistry</topic><topic>Exact sciences and technology</topic><topic>General and physical chemistry</topic><topic>Kinetics and mechanism of reactions</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>BRESSERS, P. M. M. C</creatorcontrib><creatorcontrib>KNAPEN, J. W. J</creatorcontrib><creatorcontrib>MEULENKAMP, E. A</creatorcontrib><creatorcontrib>KELLY, J. J</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Applied physics letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>BRESSERS, P. M. M. C</au><au>KNAPEN, J. W. J</au><au>MEULENKAMP, E. A</au><au>KELLY, J. J</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Visible light emission from a porous silicon/solution diode</atitle><jtitle>Applied physics letters</jtitle><date>1992-07-06</date><risdate>1992</risdate><volume>61</volume><issue>1</issue><spage>108</spage><epage>110</epage><pages>108-110</pages><issn>0003-6951</issn><eissn>1077-3118</eissn><coden>APPLAB</coden><abstract>Reduction of S2O82− ions at the interface between an n-type porous Si electrode and an aqueous solution gives rise to electroluminescence showing evidence of quantization effects. A broad emission band with a maximum at 670 nm is observed similar to the photoluminescence spectrum of the same layers. The results suggest that holes are ‘‘injected’’ into the valence band of the porous semiconductor from an intermediate of the reduction reaction, the SO4−⋅ radical ion. The resulting electron-hole recombination is responsible for the visible light emission.</abstract><cop>Melville, NY</cop><pub>American Institute of Physics</pub><doi>10.1063/1.108470</doi><tpages>3</tpages><oa>free_for_read</oa></addata></record>
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subjects Chemistry
Electrochemistry
Exact sciences and technology
General and physical chemistry
Kinetics and mechanism of reactions
title Visible light emission from a porous silicon/solution diode
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-08T13%3A40%3A17IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Visible%20light%20emission%20from%20a%20porous%20silicon/solution%20diode&rft.jtitle=Applied%20physics%20letters&rft.au=BRESSERS,%20P.%20M.%20M.%20C&rft.date=1992-07-06&rft.volume=61&rft.issue=1&rft.spage=108&rft.epage=110&rft.pages=108-110&rft.issn=0003-6951&rft.eissn=1077-3118&rft.coden=APPLAB&rft_id=info:doi/10.1063/1.108470&rft_dat=%3Cproquest_cross%3E25940304%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=25940304&rft_id=info:pmid/&rfr_iscdi=true