Pulsed electrodeposition of copper/nickel multilayers on a rotating disk electrode. I: Galvanostatic deposition
Thin Cu/Ni multilayers were deposited on a rotating disk electrode by square-wave galvanostatic pulses in one-third and full strength Watts nickel baths with 50 to 1000 ppm Cu exp 2+ . A theoretical model was developed to predict the copper content in the Ni layer. Factors affecting the deposition w...
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Veröffentlicht in: | Journal of the Electrochemical Society 1995-09, Vol.142 (9), p.3034-3040 |
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creator | CHUN-CHEN YANG CHEH, H. Y |
description | Thin Cu/Ni multilayers were deposited on a rotating disk electrode by square-wave galvanostatic pulses in one-third and full strength Watts nickel baths with 50 to 1000 ppm Cu exp 2+ . A theoretical model was developed to predict the copper content in the Ni layer. Factors affecting the deposition which include the mass-transfer rate, Cu ion concentration, temperature, and applied current density were studied. The Cu content in the Ni layer was analyzed experimentally by x-ray diffraction and potentiodynamic stripping. Theoretical predictions are in good agreement with experimental results. |
doi_str_mv | 10.1149/1.2048681 |
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Theoretical predictions are in good agreement with experimental results.</description><identifier>ISSN: 0013-4651</identifier><identifier>EISSN: 1945-7111</identifier><identifier>DOI: 10.1149/1.2048681</identifier><identifier>CODEN: JESOAN</identifier><language>eng</language><publisher>Pennington, NJ: Electrochemical Society</publisher><subject>Chemistry ; Electrochemistry ; Electrodeposition ; Exact sciences and technology ; General and physical chemistry ; Study of interfaces</subject><ispartof>Journal of the Electrochemical Society, 1995-09, Vol.142 (9), p.3034-3040</ispartof><rights>1995 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c202t-2959a6982f6ab19ef253880f711592c187153a42109927a0b37d059c3e47fe2b3</citedby></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=3656313$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>CHUN-CHEN YANG</creatorcontrib><creatorcontrib>CHEH, H. Y</creatorcontrib><title>Pulsed electrodeposition of copper/nickel multilayers on a rotating disk electrode. I: Galvanostatic deposition</title><title>Journal of the Electrochemical Society</title><description>Thin Cu/Ni multilayers were deposited on a rotating disk electrode by square-wave galvanostatic pulses in one-third and full strength Watts nickel baths with 50 to 1000 ppm Cu exp 2+ . A theoretical model was developed to predict the copper content in the Ni layer. Factors affecting the deposition which include the mass-transfer rate, Cu ion concentration, temperature, and applied current density were studied. The Cu content in the Ni layer was analyzed experimentally by x-ray diffraction and potentiodynamic stripping. Theoretical predictions are in good agreement with experimental results.</description><subject>Chemistry</subject><subject>Electrochemistry</subject><subject>Electrodeposition</subject><subject>Exact sciences and technology</subject><subject>General and physical chemistry</subject><subject>Study of interfaces</subject><issn>0013-4651</issn><issn>1945-7111</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1995</creationdate><recordtype>article</recordtype><recordid>eNpFkE1LAzEQhoMoWKsH_0EOInjYNpOP3Y03KVoLBT3oeclmE4lNN2uyK_Tfu6XFnoZhnnmGeRG6BTID4HIOM0p4mZdwhiYgucgKADhHE0KAZTwXcImuUvoeWyh5MUHhffDJNNh4o_sYGtOF5HoXWhws1qHrTJy3Tm-Mx9vB986rnYkJj3OFY-hV79ov3Li0ORlmePWIl8r_qjakPaHxSXuNLqwaL94c6xR9vjx_LF6z9dtytXhaZ5oS2mdUCqlyWVKbqxqksVSwsiR2_EZIqqEsQDDFKRApaaFIzYqGCKmZ4YU1tGZTdH_wdjH8DCb11dYlbbxXrQlDqqiQRHJZjODDAdQxpBSNrbrotiruKiDVPtIKqmOkI3t3lKqklbdRtdql_wWWi5wBY39K_nXA</recordid><startdate>19950901</startdate><enddate>19950901</enddate><creator>CHUN-CHEN YANG</creator><creator>CHEH, H. 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Y</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c202t-2959a6982f6ab19ef253880f711592c187153a42109927a0b37d059c3e47fe2b3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1995</creationdate><topic>Chemistry</topic><topic>Electrochemistry</topic><topic>Electrodeposition</topic><topic>Exact sciences and technology</topic><topic>General and physical chemistry</topic><topic>Study of interfaces</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>CHUN-CHEN YANG</creatorcontrib><creatorcontrib>CHEH, H. Y</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><jtitle>Journal of the Electrochemical Society</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>CHUN-CHEN YANG</au><au>CHEH, H. Y</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Pulsed electrodeposition of copper/nickel multilayers on a rotating disk electrode. I: Galvanostatic deposition</atitle><jtitle>Journal of the Electrochemical Society</jtitle><date>1995-09-01</date><risdate>1995</risdate><volume>142</volume><issue>9</issue><spage>3034</spage><epage>3040</epage><pages>3034-3040</pages><issn>0013-4651</issn><eissn>1945-7111</eissn><coden>JESOAN</coden><abstract>Thin Cu/Ni multilayers were deposited on a rotating disk electrode by square-wave galvanostatic pulses in one-third and full strength Watts nickel baths with 50 to 1000 ppm Cu exp 2+ . A theoretical model was developed to predict the copper content in the Ni layer. Factors affecting the deposition which include the mass-transfer rate, Cu ion concentration, temperature, and applied current density were studied. The Cu content in the Ni layer was analyzed experimentally by x-ray diffraction and potentiodynamic stripping. Theoretical predictions are in good agreement with experimental results.</abstract><cop>Pennington, NJ</cop><pub>Electrochemical Society</pub><doi>10.1149/1.2048681</doi><tpages>7</tpages></addata></record> |
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source | Institute of Physics Journals |
subjects | Chemistry Electrochemistry Electrodeposition Exact sciences and technology General and physical chemistry Study of interfaces |
title | Pulsed electrodeposition of copper/nickel multilayers on a rotating disk electrode. I: Galvanostatic deposition |
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