Single-crystalline, epitaxial cubic SiC films grown on (100) Si at 750°C by chemical vapor deposition
Single-crystalline, epitaxial cubic (100) SiC films have been grown on (100) Si substrates at 750 °C by low-pressure chemical vapor deposition, using methylsilane, SiCH3H3, a single precursor with a Si:C ratio of 1:1, and H2. This epitaxial growth temperature is the lowest reported to date. The film...
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Veröffentlicht in: | Applied physics letters 1992-04, Vol.60 (14), p.1703-1705 |
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creator | GOLECKI, I REIDINGER, F MARTI, J |
description | Single-crystalline, epitaxial cubic (100) SiC films have been grown on (100) Si substrates at 750 °C by low-pressure chemical vapor deposition, using methylsilane, SiCH3H3, a single precursor with a Si:C ratio of 1:1, and H2. This epitaxial growth temperature is the lowest reported to date. The films were characterized by means of transmission electron microscopy, x-ray diffraction, infrared transmission, four-point probe and other methods. Based on double-crystal x-ray diffractometry, the crystalline quality of our films is equivalent to that of commercial films of similar thickness. The letter describes the novel growth apparatus used and the properties of the films. |
doi_str_mv | 10.1063/1.107191 |
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This epitaxial growth temperature is the lowest reported to date. The films were characterized by means of transmission electron microscopy, x-ray diffraction, infrared transmission, four-point probe and other methods. Based on double-crystal x-ray diffractometry, the crystalline quality of our films is equivalent to that of commercial films of similar thickness. 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This epitaxial growth temperature is the lowest reported to date. The films were characterized by means of transmission electron microscopy, x-ray diffraction, infrared transmission, four-point probe and other methods. Based on double-crystal x-ray diffractometry, the crystalline quality of our films is equivalent to that of commercial films of similar thickness. 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This epitaxial growth temperature is the lowest reported to date. The films were characterized by means of transmission electron microscopy, x-ray diffraction, infrared transmission, four-point probe and other methods. Based on double-crystal x-ray diffractometry, the crystalline quality of our films is equivalent to that of commercial films of similar thickness. The letter describes the novel growth apparatus used and the properties of the films.</abstract><cop>Melville, NY</cop><pub>American Institute of Physics</pub><doi>10.1063/1.107191</doi><tpages>3</tpages></addata></record> |
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subjects | Chemical vapor deposition (including plasma-enhanced cvd, mocvd, etc.) Cross-disciplinary physics: materials science rheology Exact sciences and technology Materials science Methods of deposition of films and coatings film growth and epitaxy Physics |
title | Single-crystalline, epitaxial cubic SiC films grown on (100) Si at 750°C by chemical vapor deposition |
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