Microimaging and off-line microscopy of fine particles and inclusions

Characterization of large numbers of fine particles or inclusions is of increasing importance to assist in (1) evaluating metal or ceramic powders as candidates for compaction or use in composite materials, (2) monitoring environmental effects of particles produced in manufacturing processes and (3)...

Ausführliche Beschreibung

Bibliographische Detailangaben

Veröffentlicht in:	Materials science & engineering. A, Structural materials : properties, microstructure and processing Structural materials : properties, microstructure and processing, 1990-04, Vol.124 (1), p.49-54
Hauptverfasser:	Schwoeble, A.J., Lentz, H.P., Mershon, W.J., Casuccio, G.S.
Format:	Artikel
Sprache:	eng
Schlagworte:	Electron, positron and ion microscopes, electron diffractometers and related techniques Exact sciences and technology Instruments, apparatus, components and techniques common to several branches of physics and astronomy Physics
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!