Destruction of the quantum well structure of thin silicon-germanium superlattices by ion implantation

Thin SimGen superlattices (SLs) have been implanted with dopant and neutral ions and annealed at low temperature (600 °C) during a short time (30 min). Intermixing between the two species takes place when the SL has been rendered amorphous. This effect is due to disorder only and no dopant impurity...

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Veröffentlicht in:Applied physics letters 1992-04, Vol.60 (14), p.1673-1675
Hauptverfasser: FREIMAN, W, BESERMAN, R, DETTMER, K, KESSLER, F. R
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container_issue 14
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container_title Applied physics letters
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creator FREIMAN, W
BESERMAN, R
DETTMER, K
KESSLER, F. R
description Thin SimGen superlattices (SLs) have been implanted with dopant and neutral ions and annealed at low temperature (600 °C) during a short time (30 min). Intermixing between the two species takes place when the SL has been rendered amorphous. This effect is due to disorder only and no dopant impurity influence could be seen in contrast to the case of III–V SLs.
doi_str_mv 10.1063/1.107233
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subjects Condensed matter: structure, mechanical and thermal properties
Exact sciences and technology
Low-dimensional structures (superlattices, quantum well structures, multilayers): structure, and nonelectronic properties
Physics
Surfaces and interfaces
thin films and whiskers (structure and nonelectronic properties)
title Destruction of the quantum well structure of thin silicon-germanium superlattices by ion implantation
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