Technology of superconducting thin films on Si, SiO sub(2), and Si sub(3)N sub(4) for vacuum microelectronics
A study of YBaCuO films on Si, SiO sub(2), and Si sub(3)N sub(4) substrates demonstrates that rapid thermal processing can suppress the film-substrate reaction during the post-growth oxygen annealing. With the onset of superconductivity above 95 K, YBaCuO films annealed for 6 s at 940 degree C show...
Gespeichert in:
Veröffentlicht in: | IEEE transactions on electron devices 1989-01, Vol.36 (11), p.2693-2696 |
---|---|
Hauptverfasser: | , , , , , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | 2696 |
---|---|
container_issue | 11 |
container_start_page | 2693 |
container_title | IEEE transactions on electron devices |
container_volume | 36 |
creator | Aslam, M Soltis, R E Logothetis, E M Chase, R E Wenger, L E Chen, J T |
description | A study of YBaCuO films on Si, SiO sub(2), and Si sub(3)N sub(4) substrates demonstrates that rapid thermal processing can suppress the film-substrate reaction during the post-growth oxygen annealing. With the onset of superconductivity above 95 K, YBaCuO films annealed for 6 s at 940 degree C show T sub(c)(0) above 70 K for the SiO sub(2)-Si substrate. These results as well as results of others suggest that high T sub(c) oxide superconductors could be used as electron sources or as cold emitters, gates, and collectors. |
format | Article |
fullrecord | <record><control><sourceid>proquest</sourceid><recordid>TN_cdi_proquest_miscellaneous_25490466</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>25490466</sourcerecordid><originalsourceid>FETCH-proquest_miscellaneous_254904663</originalsourceid><addsrcrecordid>eNqNiksKwjAUALNQsH7u8FZioYXaxmLXorjShd2XGlONJHk1rxG8vaV4ABfDMDAjFiTJehsX2TabsCnRs8-c8zRgppTiYVHj_QPYAPlWOoH25kWn7B26h7LQKG0I0MJFRT3n_rqu0jCC2t76HjILT4N5CA06eNfCewNGCYdSS9E5tErQnI2bWpNc_Dxjy8O-3B3j1uHLS-oqo0hIrWsr0VOVbniR8DzP_h6_DIZKIQ</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>25490466</pqid></control><display><type>article</type><title>Technology of superconducting thin films on Si, SiO sub(2), and Si sub(3)N sub(4) for vacuum microelectronics</title><source>IEEE Electronic Library (IEL)</source><creator>Aslam, M ; Soltis, R E ; Logothetis, E M ; Chase, R E ; Wenger, L E ; Chen, J T</creator><creatorcontrib>Aslam, M ; Soltis, R E ; Logothetis, E M ; Chase, R E ; Wenger, L E ; Chen, J T</creatorcontrib><description>A study of YBaCuO films on Si, SiO sub(2), and Si sub(3)N sub(4) substrates demonstrates that rapid thermal processing can suppress the film-substrate reaction during the post-growth oxygen annealing. With the onset of superconductivity above 95 K, YBaCuO films annealed for 6 s at 940 degree C show T sub(c)(0) above 70 K for the SiO sub(2)-Si substrate. These results as well as results of others suggest that high T sub(c) oxide superconductors could be used as electron sources or as cold emitters, gates, and collectors.</description><identifier>ISSN: 0018-9383</identifier><language>eng</language><ispartof>IEEE transactions on electron devices, 1989-01, Vol.36 (11), p.2693-2696</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780</link.rule.ids></links><search><creatorcontrib>Aslam, M</creatorcontrib><creatorcontrib>Soltis, R E</creatorcontrib><creatorcontrib>Logothetis, E M</creatorcontrib><creatorcontrib>Chase, R E</creatorcontrib><creatorcontrib>Wenger, L E</creatorcontrib><creatorcontrib>Chen, J T</creatorcontrib><title>Technology of superconducting thin films on Si, SiO sub(2), and Si sub(3)N sub(4) for vacuum microelectronics</title><title>IEEE transactions on electron devices</title><description>A study of YBaCuO films on Si, SiO sub(2), and Si sub(3)N sub(4) substrates demonstrates that rapid thermal processing can suppress the film-substrate reaction during the post-growth oxygen annealing. With the onset of superconductivity above 95 K, YBaCuO films annealed for 6 s at 940 degree C show T sub(c)(0) above 70 K for the SiO sub(2)-Si substrate. These results as well as results of others suggest that high T sub(c) oxide superconductors could be used as electron sources or as cold emitters, gates, and collectors.</description><issn>0018-9383</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1989</creationdate><recordtype>article</recordtype><recordid>eNqNiksKwjAUALNQsH7u8FZioYXaxmLXorjShd2XGlONJHk1rxG8vaV4ABfDMDAjFiTJehsX2TabsCnRs8-c8zRgppTiYVHj_QPYAPlWOoH25kWn7B26h7LQKG0I0MJFRT3n_rqu0jCC2t76HjILT4N5CA06eNfCewNGCYdSS9E5tErQnI2bWpNc_Dxjy8O-3B3j1uHLS-oqo0hIrWsr0VOVbniR8DzP_h6_DIZKIQ</recordid><startdate>19890101</startdate><enddate>19890101</enddate><creator>Aslam, M</creator><creator>Soltis, R E</creator><creator>Logothetis, E M</creator><creator>Chase, R E</creator><creator>Wenger, L E</creator><creator>Chen, J T</creator><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>19890101</creationdate><title>Technology of superconducting thin films on Si, SiO sub(2), and Si sub(3)N sub(4) for vacuum microelectronics</title><author>Aslam, M ; Soltis, R E ; Logothetis, E M ; Chase, R E ; Wenger, L E ; Chen, J T</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-proquest_miscellaneous_254904663</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1989</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Aslam, M</creatorcontrib><creatorcontrib>Soltis, R E</creatorcontrib><creatorcontrib>Logothetis, E M</creatorcontrib><creatorcontrib>Chase, R E</creatorcontrib><creatorcontrib>Wenger, L E</creatorcontrib><creatorcontrib>Chen, J T</creatorcontrib><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE transactions on electron devices</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Aslam, M</au><au>Soltis, R E</au><au>Logothetis, E M</au><au>Chase, R E</au><au>Wenger, L E</au><au>Chen, J T</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Technology of superconducting thin films on Si, SiO sub(2), and Si sub(3)N sub(4) for vacuum microelectronics</atitle><jtitle>IEEE transactions on electron devices</jtitle><date>1989-01-01</date><risdate>1989</risdate><volume>36</volume><issue>11</issue><spage>2693</spage><epage>2696</epage><pages>2693-2696</pages><issn>0018-9383</issn><abstract>A study of YBaCuO films on Si, SiO sub(2), and Si sub(3)N sub(4) substrates demonstrates that rapid thermal processing can suppress the film-substrate reaction during the post-growth oxygen annealing. With the onset of superconductivity above 95 K, YBaCuO films annealed for 6 s at 940 degree C show T sub(c)(0) above 70 K for the SiO sub(2)-Si substrate. These results as well as results of others suggest that high T sub(c) oxide superconductors could be used as electron sources or as cold emitters, gates, and collectors.</abstract></addata></record> |
fulltext | fulltext |
identifier | ISSN: 0018-9383 |
ispartof | IEEE transactions on electron devices, 1989-01, Vol.36 (11), p.2693-2696 |
issn | 0018-9383 |
language | eng |
recordid | cdi_proquest_miscellaneous_25490466 |
source | IEEE Electronic Library (IEL) |
title | Technology of superconducting thin films on Si, SiO sub(2), and Si sub(3)N sub(4) for vacuum microelectronics |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-13T12%3A01%3A35IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Technology%20of%20superconducting%20thin%20films%20on%20Si,%20SiO%20sub(2),%20and%20Si%20sub(3)N%20sub(4)%20for%20vacuum%20microelectronics&rft.jtitle=IEEE%20transactions%20on%20electron%20devices&rft.au=Aslam,%20M&rft.date=1989-01-01&rft.volume=36&rft.issue=11&rft.spage=2693&rft.epage=2696&rft.pages=2693-2696&rft.issn=0018-9383&rft_id=info:doi/&rft_dat=%3Cproquest%3E25490466%3C/proquest%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=25490466&rft_id=info:pmid/&rfr_iscdi=true |