Evaluation of automated particle picking for cryogenic electron microscopy using high‐precision transmission electron microscope simulation based on a multi‐slice method

This work describes the GRIPS automated particle‐picking software for cryogenic electron microscopy and the evaluation of this software using elbis, a high‐precision transmission electron microscope (TEM) image simulator. The goal was to develop a method that can pick particles under a small defocus...

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Veröffentlicht in:	Acta crystallographica. Section D, Biological crystallography. Biological crystallography., 2021-07, Vol.77 (7), p.966-979
Hauptverfasser:	Ohashi, Masataka, Hosokawa, Fumio, Shinkawa, Takao, Iwasaki, Kenji
Format:	Artikel
Sprache:	eng
Schlagworte:	automated particle picking Automation Computer programs cryo‐electron microscopy Electron microscopes Electron microscopy Evaluation GRIPS Image transmission mask processing Microscopy multi‐slice method precision TEM simulation Preferred orientation Simulation single‐particle analysis Slice method Software Transmission electron microscopy
Online-Zugang:	Volltext
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