Stripline resonator measurements of Zs versus Hrf in YBa2Cu3O(7-x) thin films

Stripline resonator measurements of Zs versus Hrf in YBa2Cu3O(7-x) thin films

A report is presented on measurements of the surface impedance, ZS, of YBa2Cu3O(7-x) thin films using a stripline resonator. The films were deposited on LaAlO3 substrates by off-axis magnetron sputtering. The authors obtained ZS as a function of frequency from 1.5 to 20 GHz, as a function of tempera...

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Veröffentlicht in:IEEE transactions on microwave theory and techniques 1991-09, Vol.39, p.1522-1529
Hauptverfasser: Oates, Daniele, ANDERSON, ALFREDOC, SHEEN, DAVIDM, Ali, Samim
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ANDERSON, ALFREDOC
SHEEN, DAVIDM
Ali, Samim
description A report is presented on measurements of the surface impedance, ZS, of YBa2Cu3O(7-x) thin films using a stripline resonator. The films were deposited on LaAlO3 substrates by off-axis magnetron sputtering. The authors obtained ZS as a function of frequency from 1.5 to 20 GHz, as a function of temperature from 4 K to the transition temperature (about 90 K), and as a function of the RF magnetic field from zero to 300 Oe. At low temperatures the surface resistance, RS, of the films shows a very weak dependence on the magnetic field up to 225 to 250 Oe. At 77 K, RS is proportional to the square of the field. The The penetration depth shows a much weaker dependence on the field than does RS. The origins of the magnetic field dependence of ZS are also discussed. (I.E.)
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fullrecord <record><control><sourceid>proquest</sourceid><recordid>TN_cdi_proquest_miscellaneous_25471254</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>25471254</sourcerecordid><originalsourceid>FETCH-proquest_miscellaneous_254712543</originalsourceid><addsrcrecordid>eNqNirsKwjAUhjMoWC_vcCbRoZDeaF0tios46KJLCXKCkVxqTiI-vh18AJf_4_v4RyzhPGvSTdnwCZsSPQctK94k7HgOXvVaWQSP5KwIzoNBQdGjQRsInIQbwRs9RYKDl6AsXLcib2NxWtXpZw3hMSSptKE5G0uhCRc_zthyv7u0h7T37hWRQmcU3VFrYdFF6vKqrLNhir-PX2ElP1w</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>25471254</pqid></control><display><type>article</type><title>Stripline resonator measurements of Zs versus Hrf in YBa2Cu3O(7-x) thin films</title><source>IEEE Electronic Library (IEL)</source><creator>Oates, Daniele ; ANDERSON, ALFREDOC ; SHEEN, DAVIDM ; Ali, Samim</creator><creatorcontrib>Oates, Daniele ; ANDERSON, ALFREDOC ; SHEEN, DAVIDM ; Ali, Samim</creatorcontrib><description>A report is presented on measurements of the surface impedance, ZS, of YBa2Cu3O(7-x) thin films using a stripline resonator. The films were deposited on LaAlO3 substrates by off-axis magnetron sputtering. The authors obtained ZS as a function of frequency from 1.5 to 20 GHz, as a function of temperature from 4 K to the transition temperature (about 90 K), and as a function of the RF magnetic field from zero to 300 Oe. At low temperatures the surface resistance, RS, of the films shows a very weak dependence on the magnetic field up to 225 to 250 Oe. At 77 K, RS is proportional to the square of the field. The The penetration depth shows a much weaker dependence on the field than does RS. The origins of the magnetic field dependence of ZS are also discussed. (I.E.)</description><identifier>ISSN: 0018-9480</identifier><language>eng</language><ispartof>IEEE transactions on microwave theory and techniques, 1991-09, Vol.39, p.1522-1529</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784</link.rule.ids></links><search><creatorcontrib>Oates, Daniele</creatorcontrib><creatorcontrib>ANDERSON, ALFREDOC</creatorcontrib><creatorcontrib>SHEEN, DAVIDM</creatorcontrib><creatorcontrib>Ali, Samim</creatorcontrib><title>Stripline resonator measurements of Zs versus Hrf in YBa2Cu3O(7-x) thin films</title><title>IEEE transactions on microwave theory and techniques</title><description>A report is presented on measurements of the surface impedance, ZS, of YBa2Cu3O(7-x) thin films using a stripline resonator. The films were deposited on LaAlO3 substrates by off-axis magnetron sputtering. The authors obtained ZS as a function of frequency from 1.5 to 20 GHz, as a function of temperature from 4 K to the transition temperature (about 90 K), and as a function of the RF magnetic field from zero to 300 Oe. At low temperatures the surface resistance, RS, of the films shows a very weak dependence on the magnetic field up to 225 to 250 Oe. At 77 K, RS is proportional to the square of the field. The The penetration depth shows a much weaker dependence on the field than does RS. The origins of the magnetic field dependence of ZS are also discussed. (I.E.)</description><issn>0018-9480</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1991</creationdate><recordtype>article</recordtype><recordid>eNqNirsKwjAUhjMoWC_vcCbRoZDeaF0tios46KJLCXKCkVxqTiI-vh18AJf_4_v4RyzhPGvSTdnwCZsSPQctK94k7HgOXvVaWQSP5KwIzoNBQdGjQRsInIQbwRs9RYKDl6AsXLcib2NxWtXpZw3hMSSptKE5G0uhCRc_zthyv7u0h7T37hWRQmcU3VFrYdFF6vKqrLNhir-PX2ElP1w</recordid><startdate>19910901</startdate><enddate>19910901</enddate><creator>Oates, Daniele</creator><creator>ANDERSON, ALFREDOC</creator><creator>SHEEN, DAVIDM</creator><creator>Ali, Samim</creator><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope></search><sort><creationdate>19910901</creationdate><title>Stripline resonator measurements of Zs versus Hrf in YBa2Cu3O(7-x) thin films</title><author>Oates, Daniele ; ANDERSON, ALFREDOC ; SHEEN, DAVIDM ; Ali, Samim</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-proquest_miscellaneous_254712543</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1991</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Oates, Daniele</creatorcontrib><creatorcontrib>ANDERSON, ALFREDOC</creatorcontrib><creatorcontrib>SHEEN, DAVIDM</creatorcontrib><creatorcontrib>Ali, Samim</creatorcontrib><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE transactions on microwave theory and techniques</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Oates, Daniele</au><au>ANDERSON, ALFREDOC</au><au>SHEEN, DAVIDM</au><au>Ali, Samim</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Stripline resonator measurements of Zs versus Hrf in YBa2Cu3O(7-x) thin films</atitle><jtitle>IEEE transactions on microwave theory and techniques</jtitle><date>1991-09-01</date><risdate>1991</risdate><volume>39</volume><spage>1522</spage><epage>1529</epage><pages>1522-1529</pages><issn>0018-9480</issn><abstract>A report is presented on measurements of the surface impedance, ZS, of YBa2Cu3O(7-x) thin films using a stripline resonator. The films were deposited on LaAlO3 substrates by off-axis magnetron sputtering. The authors obtained ZS as a function of frequency from 1.5 to 20 GHz, as a function of temperature from 4 K to the transition temperature (about 90 K), and as a function of the RF magnetic field from zero to 300 Oe. At low temperatures the surface resistance, RS, of the films shows a very weak dependence on the magnetic field up to 225 to 250 Oe. At 77 K, RS is proportional to the square of the field. The The penetration depth shows a much weaker dependence on the field than does RS. The origins of the magnetic field dependence of ZS are also discussed. (I.E.)</abstract></addata></record>
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title Stripline resonator measurements of Zs versus Hrf in YBa2Cu3O(7-x) thin films
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-27T02%3A40%3A57IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Stripline%20resonator%20measurements%20of%20Zs%20versus%20Hrf%20in%20YBa2Cu3O(7-x)%20thin%20films&rft.jtitle=IEEE%20transactions%20on%20microwave%20theory%20and%20techniques&rft.au=Oates,%20Daniele&rft.date=1991-09-01&rft.volume=39&rft.spage=1522&rft.epage=1529&rft.pages=1522-1529&rft.issn=0018-9480&rft_id=info:doi/&rft_dat=%3Cproquest%3E25471254%3C/proquest%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=25471254&rft_id=info:pmid/&rfr_iscdi=true