Optimal low-frequency noise criteria used as a reliability test for BJTs and experimental results

Two basic problems in the application of noise criteria to reliability testing are considered. First, the need to look at all noise mechanisms rather than noise at a specific frequency is emphasized, and noise criteria using both 1 f noise and g− r noise are established. Second, the physical mechani...

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Veröffentlicht in:	Microelectronics and reliability 1991, Vol.31 (1), p.75-78
1. Verfasser:	Dai, Yisong
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences Electronics Exact sciences and technology General (including economical and industrial fields)
Online-Zugang:	Volltext
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