Preparation and characterization of grain boundary Josephson junction from amorphous thin film

To prepare the grain boundary Josephson junction, Y-Ba-Cu-O amorphous thin film was first etched into a bridge shape and then annealed at a high temperature, 990°C, to form grain boundaries. The bridge thus prepared showed clear Shapiro steps under the irradiation of microwaves at 4.2 K. Grains of t...

Ausführliche Beschreibung

Bibliographische Detailangaben

Veröffentlicht in:	Japanese Journal of Applied Physics 1991-05, Vol.30 (5), p.929-933
Hauptverfasser:	SHINOHARA, T, ENAMI, H, KAWAHARA, N, KAWABATA, S, HOSHIZAKI, H, IMURA, T
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences Electronics Exact sciences and technology Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Superconducting devices
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!