Low energy electron oscillations during epitaxial growth of thin films

The specularly reflected intensity of low energy (12 eV) electrons were measured as a function of the deposition time during the growth of Cu-thin films on fcc-Co(100) and cobalt-thin films on Cu(100). The measured curves show pronounced periodical oscillations. The origin of these oscillations is i...

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Veröffentlicht in:	Zeitschrift f r Physik B Condensed Matter 1991-06, Vol.85 (2), p.311-314
Hauptverfasser:	KERKMANN, D, PESCIA, D, KREWER, J. W, VESCOVO, E
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences Condensed matter: structure, mechanical and thermal properties Exact sciences and technology Metals. Metallurgy Physics Solid surfaces and solid-solid interfaces Surface and interface dynamics and vibrations Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties) Thin film structure and morphology
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