Lattice Location of Fission Products in UO sub 2 Single Crystals

Heavy fission product ions (Te, Xe, Cs) were implanted in UO sub 2 single crystals at 50 keV to high fluences between 5 x 10 exp 15 -1 x 10 exp 17 ions/cm exp 2 . The implantations were performed at 77K (Te, Xe) and 293K (all three elements). The crystals were subsequently analyzed in situ using the...

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Veröffentlicht in:	Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms Beam interactions with materials and atoms, 1991-06, Vol.B65 (1-4), p.315-318
Hauptverfasser:	Turos, A, Matzke, H J, Meyer, O
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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