X-ray topographic investigation of characteristic dislocation structure in sapphire single crystals

The characteristic triangular cross-grid dislocation structure in sapphire single crystals has been investigated by means of x-ray transmission topography. Dislocations lay on (0001) basal planes and primarily appeared as three parallel groups of straight dislocation lines. At high temperature these...

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Veröffentlicht in:	Journal of applied physics 1990-05, Vol.67 (10), p.6159-6164
Hauptverfasser:	Qiang, Zhang, Peizhen, Deng, Fuxi, Gan
Format:	Artikel
Sprache:	eng
Schlagworte:	Condensed matter: structure, mechanical and thermal properties Defects and impurities in crystals microstructure Exact sciences and technology Physics Structure of solids and liquids crystallography
Online-Zugang:	Volltext
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