Tracer diffusion in amorphous Pd-Cu-Si

Systematic measurements of tungsten, Ir, Pt, Au, Hg, Tl, Pb, and bismuth tracer diffusion have been performed in melt-spun amorphous Pd sub 78 Cu sub 6 Si sub 16 ribbons. The impurities were introduced by ion implantation, and diffusional changes of the depth profiles were measured by Rutherford bac...

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Veröffentlicht in:	Physical review. B, Condensed matter Condensed matter, 1988-06, Vol.37 (17), p.9951-9954
Hauptverfasser:	BØTTIGER, J, DYRBYE, K, PAMPUS, K, TORP, B, WIENE, P. H
Format:	Artikel
Sprache:	eng
Schlagworte:	Condensed matter: structure, mechanical and thermal properties Cross-disciplinary physics: materials science rheology Diffusion in solids Diffusion of impurities Exact sciences and technology Materials science Metals, semimetals and alloys Physics Specific materials Transport properties of condensed matter (nonelectronic)
Online-Zugang:	Volltext
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