Tracer diffusion in amorphous Pd-Cu-Si

Tracer diffusion in amorphous Pd-Cu-Si

Systematic measurements of tungsten, Ir, Pt, Au, Hg, Tl, Pb, and bismuth tracer diffusion have been performed in melt-spun amorphous Pd sub 78 Cu sub 6 Si sub 16 ribbons. The impurities were introduced by ion implantation, and diffusional changes of the depth profiles were measured by Rutherford bac...

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Veröffentlicht in:Physical review. B, Condensed matter Condensed matter, 1988-06, Vol.37 (17), p.9951-9954
Hauptverfasser: BØTTIGER, J, DYRBYE, K, PAMPUS, K, TORP, B, WIENE, P. H
Format: Artikel
Sprache:eng
Schlagworte:
Condensed matter: structure, mechanical and thermal properties
Cross-disciplinary physics: materials science
rheology
Diffusion in solids
Diffusion of impurities
Exact sciences and technology
Materials science
Metals, semimetals and alloys
Physics
Specific materials
Transport properties of condensed matter (nonelectronic)
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Zusammenfassung:Systematic measurements of tungsten, Ir, Pt, Au, Hg, Tl, Pb, and bismuth tracer diffusion have been performed in melt-spun amorphous Pd sub 78 Cu sub 6 Si sub 16 ribbons. The impurities were introduced by ion implantation, and diffusional changes of the depth profiles were measured by Rutherford backscattering spectrometry. The observed differences in the diffusivities of various ions are discussed and compared with published data. 9 ref.--AA
ISSN:0163-1829
1095-3795
DOI:10.1103/PhysRevB.37.9951