Attenuation measurement of very low loss dielectric waveguides by the cavity resonator method applicable in the millimeter/submillimeter wavelength range
A dielectric waveguide shorted at both ends was constructed as a cavity resonator. By measuring the Q of this cavity, one can determine the attenuation constant of this guided mode on this dielectric structure. The complex permittivity of the dielectric waveguide material can also be derived from th...
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| Veröffentlicht in: | IEEE transactions on microwave theory and techniques 1988-07, Vol.36 (7), p.1160-1166 |
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| container_end_page | 1166 |
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| container_issue | 7 |
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| container_title | IEEE transactions on microwave theory and techniques |
| container_volume | 36 |
| creator | Shimabukuro, F.I. Yeh, C. |
| description | A dielectric waveguide shorted at both ends was constructed as a cavity resonator. By measuring the Q of this cavity, one can determine the attenuation constant of this guided mode on this dielectric structure. The complex permittivity of the dielectric waveguide material can also be derived from the measurements. Measurements were made at Ka-band for dielectric waveguides constructed of nonpolar, low-loss polymers, such as Teflon, polypropylene, polyethylene, polystyrene, and rexolite.< > |
| doi_str_mv | 10.1109/22.3651 |
| format | Article |
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By measuring the Q of this cavity, one can determine the attenuation constant of this guided mode on this dielectric structure. The complex permittivity of the dielectric waveguide material can also be derived from the measurements. Measurements were made at Ka-band for dielectric waveguides constructed of nonpolar, low-loss polymers, such as Teflon, polypropylene, polyethylene, polystyrene, and rexolite.< ></description><identifier>ISSN: 0018-9480</identifier><identifier>EISSN: 1557-9670</identifier><identifier>DOI: 10.1109/22.3651</identifier><identifier>CODEN: IETMAB</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Applied sciences ; Attenuation measurement ; Cavity resonators ; Circuit properties ; Dielectric loss measurement ; Dielectric losses ; Dielectric materials ; Dielectric measurements ; Electric, optical and optoelectronic circuits ; Electronics ; Exact sciences and technology ; Microwave circuits, microwave integrated circuits, microwave transmission lines, submillimeter wave circuits ; Permittivity measurement ; Polyethylene ; Polymers ; Q measurement</subject><ispartof>IEEE transactions on microwave theory and techniques, 1988-07, Vol.36 (7), p.1160-1166</ispartof><rights>1989 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c343t-d26f927fde2816018e02addef13266ee94024fc306a140fcd1c402b712931fbb3</citedby><cites>FETCH-LOGICAL-c343t-d26f927fde2816018e02addef13266ee94024fc306a140fcd1c402b712931fbb3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/3651$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,796,27924,27925,54758</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/3651$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=7138150$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Shimabukuro, F.I.</creatorcontrib><creatorcontrib>Yeh, C.</creatorcontrib><title>Attenuation measurement of very low loss dielectric waveguides by the cavity resonator method applicable in the millimeter/submillimeter wavelength range</title><title>IEEE transactions on microwave theory and techniques</title><addtitle>TMTT</addtitle><description>A dielectric waveguide shorted at both ends was constructed as a cavity resonator. 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Measurements were made at Ka-band for dielectric waveguides constructed of nonpolar, low-loss polymers, such as Teflon, polypropylene, polyethylene, polystyrene, and rexolite.< ></description><subject>Applied sciences</subject><subject>Attenuation measurement</subject><subject>Cavity resonators</subject><subject>Circuit properties</subject><subject>Dielectric loss measurement</subject><subject>Dielectric losses</subject><subject>Dielectric materials</subject><subject>Dielectric measurements</subject><subject>Electric, optical and optoelectronic circuits</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Microwave circuits, microwave integrated circuits, microwave transmission lines, submillimeter wave circuits</subject><subject>Permittivity measurement</subject><subject>Polyethylene</subject><subject>Polymers</subject><subject>Q measurement</subject><issn>0018-9480</issn><issn>1557-9670</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1988</creationdate><recordtype>article</recordtype><recordid>eNqNkT1PwzAQhi0EEqUgVkYPCKa0tpM48YgqvqRKLDBHjnNujZyk2E5Rfwr_FvdDMMJgWed79Jz8HkKXlEwoJWLK2CTlOT1CI5rnRSJ4QY7RiBBaJiIrySk68_49lllOyhH6ugsBukEG03e4BekHBy10Afcar8FtsO0_4_EeNwYsqOCMwp9yDYvBNOBxvcFhCVjJtQkb7MD3nQy9i6qw7BssVytrlKwtYNPtyNZYa2IX3NQP9W-1k1roFmGJnewWcI5OtLQeLg73GL093L_OnpL5y-Pz7G6eqDRLQ9IwrgUrdAOspDz-EgiTTQOapoxzAJERlmmVEi5pRrRqqIovdUGZSKmu63SMbvbeles_BvChao1XYK3soB98xUrOY5LZ32BOhCgE-Q9YsjIrIni7B5WLCTvQ1cqZVrpNRUm1XWbFWLVdZiSvD0rplbQ6JqSM_8ELmpY0306-2mMGAH66O8M32jCpnw</recordid><startdate>19880701</startdate><enddate>19880701</enddate><creator>Shimabukuro, F.I.</creator><creator>Yeh, C.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope><scope>7SP</scope></search><sort><creationdate>19880701</creationdate><title>Attenuation measurement of very low loss dielectric waveguides by the cavity resonator method applicable in the millimeter/submillimeter wavelength range</title><author>Shimabukuro, F.I. ; Yeh, C.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c343t-d26f927fde2816018e02addef13266ee94024fc306a140fcd1c402b712931fbb3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1988</creationdate><topic>Applied sciences</topic><topic>Attenuation measurement</topic><topic>Cavity resonators</topic><topic>Circuit properties</topic><topic>Dielectric loss measurement</topic><topic>Dielectric losses</topic><topic>Dielectric materials</topic><topic>Dielectric measurements</topic><topic>Electric, optical and optoelectronic circuits</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Microwave circuits, microwave integrated circuits, microwave transmission lines, submillimeter wave circuits</topic><topic>Permittivity measurement</topic><topic>Polyethylene</topic><topic>Polymers</topic><topic>Q measurement</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Shimabukuro, F.I.</creatorcontrib><creatorcontrib>Yeh, C.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Electronics & Communications Abstracts</collection><jtitle>IEEE transactions on microwave theory and techniques</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Shimabukuro, F.I.</au><au>Yeh, C.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Attenuation measurement of very low loss dielectric waveguides by the cavity resonator method applicable in the millimeter/submillimeter wavelength range</atitle><jtitle>IEEE transactions on microwave theory and techniques</jtitle><stitle>TMTT</stitle><date>1988-07-01</date><risdate>1988</risdate><volume>36</volume><issue>7</issue><spage>1160</spage><epage>1166</epage><pages>1160-1166</pages><issn>0018-9480</issn><eissn>1557-9670</eissn><coden>IETMAB</coden><abstract>A dielectric waveguide shorted at both ends was constructed as a cavity resonator. By measuring the Q of this cavity, one can determine the attenuation constant of this guided mode on this dielectric structure. The complex permittivity of the dielectric waveguide material can also be derived from the measurements. Measurements were made at Ka-band for dielectric waveguides constructed of nonpolar, low-loss polymers, such as Teflon, polypropylene, polyethylene, polystyrene, and rexolite.< ></abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/22.3651</doi><tpages>7</tpages></addata></record> |
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| identifier | ISSN: 0018-9480 |
| ispartof | IEEE transactions on microwave theory and techniques, 1988-07, Vol.36 (7), p.1160-1166 |
| issn | 0018-9480 1557-9670 |
| language | eng |
| recordid | cdi_proquest_miscellaneous_25082847 |
| source | IEEE Electronic Library (IEL) |
| subjects | Applied sciences Attenuation measurement Cavity resonators Circuit properties Dielectric loss measurement Dielectric losses Dielectric materials Dielectric measurements Electric, optical and optoelectronic circuits Electronics Exact sciences and technology Microwave circuits, microwave integrated circuits, microwave transmission lines, submillimeter wave circuits Permittivity measurement Polyethylene Polymers Q measurement |
| title | Attenuation measurement of very low loss dielectric waveguides by the cavity resonator method applicable in the millimeter/submillimeter wavelength range |
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