Synchrotron small-angle x-ray scattering of sulfonated polystyrene ionomers

Synchrotron radiation, with its high flux and well-defined X-ray wavelengths, is an ideal tool to investigate the detailed small-angle X-ray scattering (SAXS) profiles which are not accessible by standard X-ray sources. Hence, the precise SAXS curves of Na and Zn salts of sulfonated polystyrene can...

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Veröffentlicht in:Macromolecules 1988-02, Vol.21 (2), p.523-525
Hauptverfasser: Chu, Benjamin, Wu, Dan Qing, MacKnight, W. J, Wu, Chi, Phillips, J. C, LeGrand, A, Lantman, C. W, Lundberg, R. D
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Sprache:eng
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Zusammenfassung:Synchrotron radiation, with its high flux and well-defined X-ray wavelengths, is an ideal tool to investigate the detailed small-angle X-ray scattering (SAXS) profiles which are not accessible by standard X-ray sources. Hence, the precise SAXS curves of Na and Zn salts of sulfonated polystyrene can be measured over a very broad scattering vector q range. Furthermore, the polystyrene backbone scattering curve is subtracted from the scattering curves of the ionomers to give the excess scattered intensity due to ions in the ionomer. In conclusion, the precise SAXS patterns over a very broad q range can be achieved by using synchrotron radiation. 9 ref.--A.R.
ISSN:0024-9297
1520-5835
DOI:10.1021/ma00180a043