Structure study on Bi-Sr-Ca-Cu-O thin films prepared by low temperature process

Thin films of the Bi--Sr--Ca--Cu--O system were prepared at substrate temperatures between 550-600 deg C. The film deposited at 570 deg C showed X-ray diffraction pattern of Bi sub 2 Sr sub 2 Ca sub 2 Cu sub 3 O sub y phase and had a zero resistance temperature T sub c at 23K. After annealing at 570...

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Veröffentlicht in:	Journal of the Japan Society of Powder and Powder Metallurgy 1988, Vol.35 (9), p.989-992
Hauptverfasser:	Matsushima, Tomoaki, Hirochi, Kumiko, Setsune, Kentaro, Wasa, Kiyotaka
Format:	Artikel
Sprache:	eng ; jpn
Online-Zugang:	Volltext
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