Illumination characteristics of vortex beams in dark-field microscopic systems

Illumination characteristics of vortex beams in dark-field microscopic systems

A Laguerre-Gaussian (LG) vortex beam is employed as an illumination source for a dark-field microscopy imaging system. To discover the influences of beam characteristics on the imaging quality, an analysis model has been established to show the light-field change rule on both object and image planes...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Applied optics (2004) 2021-03, Vol.60 (8), p.2269-2274
Hauptverfasser: Wang, Yuqin, Yong, Kangle, Tang, Shanfa, Zhang, Rongzhu
Format: Artikel
Sprache:eng
Schlagworte:
Electron beams
Gaussian beams (optics)
Illumination
Imaging
Vortices
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 2274
container_issue 8
container_start_page 2269
container_title Applied optics (2004)
container_volume 60
creator Wang, Yuqin
Yong, Kangle
Tang, Shanfa
Zhang, Rongzhu
description A Laguerre-Gaussian (LG) vortex beam is employed as an illumination source for a dark-field microscopy imaging system. To discover the influences of beam characteristics on the imaging quality, an analysis model has been established to show the light-field change rule on both object and image planes. The analytic expressions of the light field on the two planes are deduced. When a rectangular defect is simulated, the light distributions on the object and image planes with different parameters are calculated. The results show that the size of the beam spot on the object plane can be changed by adjusting the topological charge of the vortex beam to obtain the best imaging effect for defects of different scales.
doi_str_mv 10.1364/AO.417110
format Article
fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_2500373288</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2504375201</sourcerecordid><originalsourceid>FETCH-LOGICAL-c313t-5f3231669749ed82c7091733b85bf8d74578938038c30c0bb10e9a9e48a0ee803</originalsourceid><addsrcrecordid>eNpdkEtLAzEUhYMotlYX_gEJuNHF1CQ3mSTLUnwUit0ouBsymQymzqMmM2L_vVNaXbi6h8vH4ZyD0CUlUwopv5utppxKSskRGjMqRAI0FcdoPEidUKbeRugsxjUhILiWp2gEkGoCjI_R86Kq-to3pvNtg-27CcZ2LvjYeRtxW-KvNnTuG-fO1BH7BhcmfCSld1WBa29DG2278RbHbexcHc_RSWmq6C4Od4JeH-5f5k_JcvW4mM-WiQUKXSJKYEPGVEuuXaGYlURTCZArkZeqkFxIpUERUBaIJXlOidNGO64McW74T9DN3ncT2s_exS6rfbSuqkzj2j5mTAxlJTClBvT6H7pu-9AM6XYUBykYoQN1u6d2lWJwZbYJvjZhm1GS7UbOZqtsP_LAXh0c-7x2xR_5uyr8AGcmdUM</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2504375201</pqid></control><display><type>article</type><title>Illumination characteristics of vortex beams in dark-field microscopic systems</title><source>Alma/SFX Local Collection</source><source>Optica Publishing Group Journals</source><creator>Wang, Yuqin ; Yong, Kangle ; Tang, Shanfa ; Zhang, Rongzhu</creator><creatorcontrib>Wang, Yuqin ; Yong, Kangle ; Tang, Shanfa ; Zhang, Rongzhu</creatorcontrib><description>A Laguerre-Gaussian (LG) vortex beam is employed as an illumination source for a dark-field microscopy imaging system. To discover the influences of beam characteristics on the imaging quality, an analysis model has been established to show the light-field change rule on both object and image planes. The analytic expressions of the light field on the two planes are deduced. When a rectangular defect is simulated, the light distributions on the object and image planes with different parameters are calculated. The results show that the size of the beam spot on the object plane can be changed by adjusting the topological charge of the vortex beam to obtain the best imaging effect for defects of different scales.</description><identifier>ISSN: 1559-128X</identifier><identifier>EISSN: 2155-3165</identifier><identifier>EISSN: 1539-4522</identifier><identifier>DOI: 10.1364/AO.417110</identifier><identifier>PMID: 33690324</identifier><language>eng</language><publisher>United States: Optical Society of America</publisher><subject>Electron beams ; Gaussian beams (optics) ; Illumination ; Imaging ; Vortices</subject><ispartof>Applied optics (2004), 2021-03, Vol.60 (8), p.2269-2274</ispartof><rights>Copyright Optical Society of America Mar 10, 2021</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c313t-5f3231669749ed82c7091733b85bf8d74578938038c30c0bb10e9a9e48a0ee803</citedby><cites>FETCH-LOGICAL-c313t-5f3231669749ed82c7091733b85bf8d74578938038c30c0bb10e9a9e48a0ee803</cites><orcidid>0000-0002-2630-2109</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,3245,27901,27902</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/33690324$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>Wang, Yuqin</creatorcontrib><creatorcontrib>Yong, Kangle</creatorcontrib><creatorcontrib>Tang, Shanfa</creatorcontrib><creatorcontrib>Zhang, Rongzhu</creatorcontrib><title>Illumination characteristics of vortex beams in dark-field microscopic systems</title><title>Applied optics (2004)</title><addtitle>Appl Opt</addtitle><description>A Laguerre-Gaussian (LG) vortex beam is employed as an illumination source for a dark-field microscopy imaging system. To discover the influences of beam characteristics on the imaging quality, an analysis model has been established to show the light-field change rule on both object and image planes. The analytic expressions of the light field on the two planes are deduced. When a rectangular defect is simulated, the light distributions on the object and image planes with different parameters are calculated. The results show that the size of the beam spot on the object plane can be changed by adjusting the topological charge of the vortex beam to obtain the best imaging effect for defects of different scales.</description><subject>Electron beams</subject><subject>Gaussian beams (optics)</subject><subject>Illumination</subject><subject>Imaging</subject><subject>Vortices</subject><issn>1559-128X</issn><issn>2155-3165</issn><issn>1539-4522</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2021</creationdate><recordtype>article</recordtype><recordid>eNpdkEtLAzEUhYMotlYX_gEJuNHF1CQ3mSTLUnwUit0ouBsymQymzqMmM2L_vVNaXbi6h8vH4ZyD0CUlUwopv5utppxKSskRGjMqRAI0FcdoPEidUKbeRugsxjUhILiWp2gEkGoCjI_R86Kq-to3pvNtg-27CcZ2LvjYeRtxW-KvNnTuG-fO1BH7BhcmfCSld1WBa29DG2278RbHbexcHc_RSWmq6C4Od4JeH-5f5k_JcvW4mM-WiQUKXSJKYEPGVEuuXaGYlURTCZArkZeqkFxIpUERUBaIJXlOidNGO64McW74T9DN3ncT2s_exS6rfbSuqkzj2j5mTAxlJTClBvT6H7pu-9AM6XYUBykYoQN1u6d2lWJwZbYJvjZhm1GS7UbOZqtsP_LAXh0c-7x2xR_5uyr8AGcmdUM</recordid><startdate>20210310</startdate><enddate>20210310</enddate><creator>Wang, Yuqin</creator><creator>Yong, Kangle</creator><creator>Tang, Shanfa</creator><creator>Zhang, Rongzhu</creator><general>Optical Society of America</general><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope><scope>7X8</scope><orcidid>https://orcid.org/0000-0002-2630-2109</orcidid></search><sort><creationdate>20210310</creationdate><title>Illumination characteristics of vortex beams in dark-field microscopic systems</title><author>Wang, Yuqin ; Yong, Kangle ; Tang, Shanfa ; Zhang, Rongzhu</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c313t-5f3231669749ed82c7091733b85bf8d74578938038c30c0bb10e9a9e48a0ee803</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2021</creationdate><topic>Electron beams</topic><topic>Gaussian beams (optics)</topic><topic>Illumination</topic><topic>Imaging</topic><topic>Vortices</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Wang, Yuqin</creatorcontrib><creatorcontrib>Yong, Kangle</creatorcontrib><creatorcontrib>Tang, Shanfa</creatorcontrib><creatorcontrib>Zhang, Rongzhu</creatorcontrib><collection>PubMed</collection><collection>CrossRef</collection><collection>Electronics &amp; Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>MEDLINE - Academic</collection><jtitle>Applied optics (2004)</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Wang, Yuqin</au><au>Yong, Kangle</au><au>Tang, Shanfa</au><au>Zhang, Rongzhu</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Illumination characteristics of vortex beams in dark-field microscopic systems</atitle><jtitle>Applied optics (2004)</jtitle><addtitle>Appl Opt</addtitle><date>2021-03-10</date><risdate>2021</risdate><volume>60</volume><issue>8</issue><spage>2269</spage><epage>2274</epage><pages>2269-2274</pages><issn>1559-128X</issn><eissn>2155-3165</eissn><eissn>1539-4522</eissn><abstract>A Laguerre-Gaussian (LG) vortex beam is employed as an illumination source for a dark-field microscopy imaging system. To discover the influences of beam characteristics on the imaging quality, an analysis model has been established to show the light-field change rule on both object and image planes. The analytic expressions of the light field on the two planes are deduced. When a rectangular defect is simulated, the light distributions on the object and image planes with different parameters are calculated. The results show that the size of the beam spot on the object plane can be changed by adjusting the topological charge of the vortex beam to obtain the best imaging effect for defects of different scales.</abstract><cop>United States</cop><pub>Optical Society of America</pub><pmid>33690324</pmid><doi>10.1364/AO.417110</doi><tpages>6</tpages><orcidid>https://orcid.org/0000-0002-2630-2109</orcidid></addata></record>
fulltext fulltext
identifier ISSN: 1559-128X
ispartof Applied optics (2004), 2021-03, Vol.60 (8), p.2269-2274
issn 1559-128X
2155-3165
1539-4522
language eng
recordid cdi_proquest_miscellaneous_2500373288
source Alma/SFX Local Collection; Optica Publishing Group Journals
subjects Electron beams
Gaussian beams (optics)
Illumination
Imaging
Vortices
title Illumination characteristics of vortex beams in dark-field microscopic systems
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-15T10%3A46%3A51IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Illumination%20characteristics%20of%20vortex%20beams%20in%20dark-field%20microscopic%20systems&rft.jtitle=Applied%20optics%20(2004)&rft.au=Wang,%20Yuqin&rft.date=2021-03-10&rft.volume=60&rft.issue=8&rft.spage=2269&rft.epage=2274&rft.pages=2269-2274&rft.issn=1559-128X&rft.eissn=2155-3165&rft_id=info:doi/10.1364/AO.417110&rft_dat=%3Cproquest_cross%3E2504375201%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2504375201&rft_id=info:pmid/33690324&rfr_iscdi=true