Influence of Silicon and Phosphorus on Structural and Magnetic Properties of Synthetic Goethite and Related Oxides

A series of synthetic goethites containing varying amounts of Si and P dopants were characterized by X-ray powder diffraction, electron diffraction, microbeam electron diffraction, and Mössbauer spectroscopy. Very low level incorporation produced materials having structural and spectral properties s...

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Veröffentlicht in:	Clays and clay minerals 1988-04, Vol.36 (2), p.165-175
Hauptverfasser:	Quin, Thomas G., Long, Gary J., Benson, Christopher G., Mann, Stephen, Williams, Robert J. P.
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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