Transition alumina structures studied using HREM
High-resolution electron microscopy (HREM) has been used to study thin films of transition aluminas. The forms of Al 2O 3 studied were γ-Al 2O 3, δ-Al 2O 3, and θ-Al 2O 3. Acomparison of information obtained using selected-area diffraction (SAD) and HREM is made, and HREM is shown to be a necessary...
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| Veröffentlicht in: | Ultramicroscopy 1985-01, Vol.18 (1), p.379-385 |
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| container_title | Ultramicroscopy |
| container_volume | 18 |
| creator | Morrissey, K.J. Czanderna, K.K. Merrill, R.P. Carter, C.B. |
| description | High-resolution electron microscopy (HREM) has been used to study thin films of transition aluminas. The forms of Al
2O
3 studied were γ-Al
2O
3, δ-Al
2O
3, and θ-Al
2O
3. Acomparison of information obtained using selected-area diffraction (SAD) and HREM is made, and HREM is shown to be a necessary part of the analysis of these forms of alumina. |
| doi_str_mv | 10.1016/0304-3991(85)90156-1 |
| format | Article |
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2O
3 studied were γ-Al
2O
3, δ-Al
2O
3, and θ-Al
2O
3. Acomparison of information obtained using selected-area diffraction (SAD) and HREM is made, and HREM is shown to be a necessary part of the analysis of these forms of alumina.</description><identifier>ISSN: 0304-3991</identifier><identifier>EISSN: 1879-2723</identifier><identifier>DOI: 10.1016/0304-3991(85)90156-1</identifier><language>eng</language><publisher>Elsevier B.V</publisher><ispartof>Ultramicroscopy, 1985-01, Vol.18 (1), p.379-385</ispartof><rights>1985</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c335t-7d9474547214e10ba2fde67399ec825ba0fa0d5c0deb8668a37332e7250af6aa3</citedby><cites>FETCH-LOGICAL-c335t-7d9474547214e10ba2fde67399ec825ba0fa0d5c0deb8668a37332e7250af6aa3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://www.sciencedirect.com/science/article/pii/0304399185901561$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>314,776,780,3537,27901,27902,65306</link.rule.ids></links><search><creatorcontrib>Morrissey, K.J.</creatorcontrib><creatorcontrib>Czanderna, K.K.</creatorcontrib><creatorcontrib>Merrill, R.P.</creatorcontrib><creatorcontrib>Carter, C.B.</creatorcontrib><title>Transition alumina structures studied using HREM</title><title>Ultramicroscopy</title><description>High-resolution electron microscopy (HREM) has been used to study thin films of transition aluminas. The forms of Al
2O
3 studied were γ-Al
2O
3, δ-Al
2O
3, and θ-Al
2O
3. Acomparison of information obtained using selected-area diffraction (SAD) and HREM is made, and HREM is shown to be a necessary part of the analysis of these forms of alumina.</description><issn>0304-3991</issn><issn>1879-2723</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1985</creationdate><recordtype>article</recordtype><recordid>eNp9kE9LAzEUxIMoWKvfwMOeRA-rL_822YsgpVqhIkg9hzR5K5Htbk02gt_erRWPnt4cfjO8GULOKVxToNUNcBAlr2t6qeVVDVRWJT0gE6pVXTLF-CGZ_CHH5CSldwCgIPSEwCraLoUh9F1h27wJnS3SELMbcsQ0yuwD-iKn0L0Vi5f50yk5amyb8Oz3Tsnr_Xw1W5TL54fH2d2ydJzLoVS-FkpIoRgVSGFtWeOxUuMH6DSTawuNBS8deFzrqtKWK84ZKibBNpW1fEou9rnb2H9kTIPZhOSwbW2HfU6GCV1xKsQIij3oYp9SxMZsY9jY-GUomN08Ztfd7LobLc3PPIaOttu9DccSnwGjSS5g59CHiG4wvg__B3wDQhxrJw</recordid><startdate>19850101</startdate><enddate>19850101</enddate><creator>Morrissey, K.J.</creator><creator>Czanderna, K.K.</creator><creator>Merrill, R.P.</creator><creator>Carter, C.B.</creator><general>Elsevier B.V</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>8FD</scope><scope>JG9</scope></search><sort><creationdate>19850101</creationdate><title>Transition alumina structures studied using HREM</title><author>Morrissey, K.J. ; Czanderna, K.K. ; Merrill, R.P. ; Carter, C.B.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c335t-7d9474547214e10ba2fde67399ec825ba0fa0d5c0deb8668a37332e7250af6aa3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1985</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Morrissey, K.J.</creatorcontrib><creatorcontrib>Czanderna, K.K.</creatorcontrib><creatorcontrib>Merrill, R.P.</creatorcontrib><creatorcontrib>Carter, C.B.</creatorcontrib><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><jtitle>Ultramicroscopy</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Morrissey, K.J.</au><au>Czanderna, K.K.</au><au>Merrill, R.P.</au><au>Carter, C.B.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Transition alumina structures studied using HREM</atitle><jtitle>Ultramicroscopy</jtitle><date>1985-01-01</date><risdate>1985</risdate><volume>18</volume><issue>1</issue><spage>379</spage><epage>385</epage><pages>379-385</pages><issn>0304-3991</issn><eissn>1879-2723</eissn><abstract>High-resolution electron microscopy (HREM) has been used to study thin films of transition aluminas. The forms of Al
2O
3 studied were γ-Al
2O
3, δ-Al
2O
3, and θ-Al
2O
3. Acomparison of information obtained using selected-area diffraction (SAD) and HREM is made, and HREM is shown to be a necessary part of the analysis of these forms of alumina.</abstract><pub>Elsevier B.V</pub><doi>10.1016/0304-3991(85)90156-1</doi><tpages>7</tpages></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0304-3991 |
| ispartof | Ultramicroscopy, 1985-01, Vol.18 (1), p.379-385 |
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| language | eng |
| recordid | cdi_proquest_miscellaneous_24863144 |
| source | Elsevier ScienceDirect Journals |
| title | Transition alumina structures studied using HREM |
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