Turn-on delay analysis of current-injection Josephson logic circuits
A turn-on delay, during which the output voltage of a Josephson logic circuit is very small, is of prime interest for the design of high-speed Josephson digital integrated circuits. We have derived an analytical formula for the turn-on delay of the current-injection logic circuits, which is in good...
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Veröffentlicht in: | J. Appl. Phys.; (United States) 1985-01, Vol.57 (11), p.5028-5035 |
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description | A turn-on delay, during which the output voltage of a Josephson logic circuit is very small, is of prime interest for the design of high-speed Josephson digital integrated circuits. We have derived an analytical formula for the turn-on delay of the current-injection logic circuits, which is in good agreement with computer simulations. Analysis of the circuit equations shows that the nonlinear inductance of a current-summing Josephson junction plays an important role for the turn-on delay. Dependences of the turn-on delay on circuit parameters and operating conditions are calculated. For parameter values typical of 5-μm current-injection circuits, the turn-on delay is on the order of 10 ps. The turn-on delay and operating margin are compared in various types of current-injection logic circuits. The higher sensitivity of the threshold gate current to the input current is found to be desirable not only to reduce the turn-on delay but to operate in a wide margin. |
doi_str_mv | 10.1063/1.335279 |
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We have derived an analytical formula for the turn-on delay of the current-injection logic circuits, which is in good agreement with computer simulations. Analysis of the circuit equations shows that the nonlinear inductance of a current-summing Josephson junction plays an important role for the turn-on delay. Dependences of the turn-on delay on circuit parameters and operating conditions are calculated. For parameter values typical of 5-μm current-injection circuits, the turn-on delay is on the order of 10 ps. The turn-on delay and operating margin are compared in various types of current-injection logic circuits. The higher sensitivity of the threshold gate current to the input current is found to be desirable not only to reduce the turn-on delay but to operate in a wide margin.</description><identifier>ISSN: 0021-8979</identifier><identifier>EISSN: 1089-7550</identifier><identifier>DOI: 10.1063/1.335279</identifier><identifier>CODEN: JAPIAU</identifier><language>eng</language><publisher>Woodbury, NY: American Institute of Physics</publisher><subject>420201 - Engineering- Cryogenic Equipment & Devices ; 420800 - Engineering- Electronic Circuits & Devices- (-1989) ; ANALYTICAL SOLUTION ; Applied sciences ; Circuit properties ; CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS ; COMPUTERIZED SIMULATION ; CURRENTS ; DATA ; DELAY CIRCUITS ; DESIGN ; DIGITAL CIRCUITS ; ELECTRIC CURRENTS ; ELECTRIC POTENTIAL ; Electric, optical and optoelectronic circuits ; ELECTRONIC CIRCUITS ; Electronics ; ENGINEERING ; Exact sciences and technology ; INFORMATION ; INTEGRATED CIRCUITS ; JOSEPHSON JUNCTIONS ; JUNCTIONS ; LOGIC CIRCUITS ; MICROELECTRONIC CIRCUITS ; NUMERICAL DATA ; OPERATION ; SENSITIVITY ; SIMULATION ; SUPERCONDUCTING JUNCTIONS ; THEORETICAL DATA ; THRESHOLD CURRENT ; TIME DELAY</subject><ispartof>J. 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Phys.; (United States), 1985-01, Vol.57 (11), p.5028-5035</ispartof><rights>1986 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c314t-76c333d1b715fb47b114221a10eb414f4abab6c44de4aa6584deae818ff47aea3</citedby><cites>FETCH-LOGICAL-c314t-76c333d1b715fb47b114221a10eb414f4abab6c44de4aa6584deae818ff47aea3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,881,27903,27904</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=8465948$$DView record in Pascal Francis$$Hfree_for_read</backlink><backlink>$$Uhttps://www.osti.gov/biblio/5781161$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>SONE, J</creatorcontrib><creatorcontrib>Microelectronics Research Laboratories, NEC Corporation, Miyazaki, 4-1-1, Miyamae-ku, Kawasaki, Kanagawa 213, Japan</creatorcontrib><title>Turn-on delay analysis of current-injection Josephson logic circuits</title><title>J. Appl. Phys.; (United States)</title><description>A turn-on delay, during which the output voltage of a Josephson logic circuit is very small, is of prime interest for the design of high-speed Josephson digital integrated circuits. We have derived an analytical formula for the turn-on delay of the current-injection logic circuits, which is in good agreement with computer simulations. Analysis of the circuit equations shows that the nonlinear inductance of a current-summing Josephson junction plays an important role for the turn-on delay. Dependences of the turn-on delay on circuit parameters and operating conditions are calculated. For parameter values typical of 5-μm current-injection circuits, the turn-on delay is on the order of 10 ps. The turn-on delay and operating margin are compared in various types of current-injection logic circuits. The higher sensitivity of the threshold gate current to the input current is found to be desirable not only to reduce the turn-on delay but to operate in a wide margin.</description><subject>420201 - Engineering- Cryogenic Equipment & Devices</subject><subject>420800 - Engineering- Electronic Circuits & Devices- (-1989)</subject><subject>ANALYTICAL SOLUTION</subject><subject>Applied sciences</subject><subject>Circuit properties</subject><subject>CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS</subject><subject>COMPUTERIZED SIMULATION</subject><subject>CURRENTS</subject><subject>DATA</subject><subject>DELAY CIRCUITS</subject><subject>DESIGN</subject><subject>DIGITAL CIRCUITS</subject><subject>ELECTRIC CURRENTS</subject><subject>ELECTRIC POTENTIAL</subject><subject>Electric, optical and optoelectronic circuits</subject><subject>ELECTRONIC CIRCUITS</subject><subject>Electronics</subject><subject>ENGINEERING</subject><subject>Exact sciences and technology</subject><subject>INFORMATION</subject><subject>INTEGRATED CIRCUITS</subject><subject>JOSEPHSON JUNCTIONS</subject><subject>JUNCTIONS</subject><subject>LOGIC CIRCUITS</subject><subject>MICROELECTRONIC CIRCUITS</subject><subject>NUMERICAL DATA</subject><subject>OPERATION</subject><subject>SENSITIVITY</subject><subject>SIMULATION</subject><subject>SUPERCONDUCTING JUNCTIONS</subject><subject>THEORETICAL DATA</subject><subject>THRESHOLD CURRENT</subject><subject>TIME DELAY</subject><issn>0021-8979</issn><issn>1089-7550</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1985</creationdate><recordtype>article</recordtype><recordid>eNo90E9LAzEQBfAgCtYq-BEWEfGyNbPJbrJHqf8peKnnMJtmbco2qZndQ7-9Ky2e5h1-PIbH2DXwGfBKPMBMiLJQ9QmbANd1rsqSn7IJ5wXkulb1Obsg2nAOoEU9YU_LIYU8hmzlOtxnGLDbk6cstpkdUnKhz33YONv70XxEcrs1jamL395m1ic7-J4u2VmLHbmr452yr5fn5fwtX3y-vs8fF7kVIPtcVVYIsYJGQdk2UjUAsigAgbtGgmwlNthUVsqVk4hVqceAToNuW6nQoZiym0NvpN4bsr53dm1jCON_plQaoIIR3R3QLsWfwVFvtp6s6zoMLg5kCqmropD1CO8P0KZIlFxrdslvMe0NcPO3pQFz2HKkt8dOJItdmzBYT_9ey6qspRa_dNRyuQ</recordid><startdate>19850101</startdate><enddate>19850101</enddate><creator>SONE, J</creator><general>American Institute of Physics</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope><scope>OTOTI</scope></search><sort><creationdate>19850101</creationdate><title>Turn-on delay analysis of current-injection Josephson logic circuits</title><author>SONE, J</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c314t-76c333d1b715fb47b114221a10eb414f4abab6c44de4aa6584deae818ff47aea3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1985</creationdate><topic>420201 - Engineering- Cryogenic Equipment & Devices</topic><topic>420800 - Engineering- Electronic Circuits & Devices- (-1989)</topic><topic>ANALYTICAL SOLUTION</topic><topic>Applied sciences</topic><topic>Circuit properties</topic><topic>CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS</topic><topic>COMPUTERIZED SIMULATION</topic><topic>CURRENTS</topic><topic>DATA</topic><topic>DELAY CIRCUITS</topic><topic>DESIGN</topic><topic>DIGITAL CIRCUITS</topic><topic>ELECTRIC CURRENTS</topic><topic>ELECTRIC POTENTIAL</topic><topic>Electric, optical and optoelectronic circuits</topic><topic>ELECTRONIC CIRCUITS</topic><topic>Electronics</topic><topic>ENGINEERING</topic><topic>Exact sciences and technology</topic><topic>INFORMATION</topic><topic>INTEGRATED CIRCUITS</topic><topic>JOSEPHSON JUNCTIONS</topic><topic>JUNCTIONS</topic><topic>LOGIC CIRCUITS</topic><topic>MICROELECTRONIC CIRCUITS</topic><topic>NUMERICAL DATA</topic><topic>OPERATION</topic><topic>SENSITIVITY</topic><topic>SIMULATION</topic><topic>SUPERCONDUCTING JUNCTIONS</topic><topic>THEORETICAL DATA</topic><topic>THRESHOLD CURRENT</topic><topic>TIME DELAY</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>SONE, J</creatorcontrib><creatorcontrib>Microelectronics Research Laboratories, NEC Corporation, Miyazaki, 4-1-1, Miyamae-ku, Kawasaki, Kanagawa 213, Japan</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>OSTI.GOV</collection><jtitle>J. Appl. Phys.; (United States)</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>SONE, J</au><aucorp>Microelectronics Research Laboratories, NEC Corporation, Miyazaki, 4-1-1, Miyamae-ku, Kawasaki, Kanagawa 213, Japan</aucorp><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Turn-on delay analysis of current-injection Josephson logic circuits</atitle><jtitle>J. Appl. Phys.; (United States)</jtitle><date>1985-01-01</date><risdate>1985</risdate><volume>57</volume><issue>11</issue><spage>5028</spage><epage>5035</epage><pages>5028-5035</pages><issn>0021-8979</issn><eissn>1089-7550</eissn><coden>JAPIAU</coden><abstract>A turn-on delay, during which the output voltage of a Josephson logic circuit is very small, is of prime interest for the design of high-speed Josephson digital integrated circuits. We have derived an analytical formula for the turn-on delay of the current-injection logic circuits, which is in good agreement with computer simulations. Analysis of the circuit equations shows that the nonlinear inductance of a current-summing Josephson junction plays an important role for the turn-on delay. Dependences of the turn-on delay on circuit parameters and operating conditions are calculated. For parameter values typical of 5-μm current-injection circuits, the turn-on delay is on the order of 10 ps. The turn-on delay and operating margin are compared in various types of current-injection logic circuits. The higher sensitivity of the threshold gate current to the input current is found to be desirable not only to reduce the turn-on delay but to operate in a wide margin.</abstract><cop>Woodbury, NY</cop><pub>American Institute of Physics</pub><doi>10.1063/1.335279</doi><tpages>8</tpages></addata></record> |
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subjects | 420201 - Engineering- Cryogenic Equipment & Devices 420800 - Engineering- Electronic Circuits & Devices- (-1989) ANALYTICAL SOLUTION Applied sciences Circuit properties CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS COMPUTERIZED SIMULATION CURRENTS DATA DELAY CIRCUITS DESIGN DIGITAL CIRCUITS ELECTRIC CURRENTS ELECTRIC POTENTIAL Electric, optical and optoelectronic circuits ELECTRONIC CIRCUITS Electronics ENGINEERING Exact sciences and technology INFORMATION INTEGRATED CIRCUITS JOSEPHSON JUNCTIONS JUNCTIONS LOGIC CIRCUITS MICROELECTRONIC CIRCUITS NUMERICAL DATA OPERATION SENSITIVITY SIMULATION SUPERCONDUCTING JUNCTIONS THEORETICAL DATA THRESHOLD CURRENT TIME DELAY |
title | Turn-on delay analysis of current-injection Josephson logic circuits |
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