Turn-on delay analysis of current-injection Josephson logic circuits

A turn-on delay, during which the output voltage of a Josephson logic circuit is very small, is of prime interest for the design of high-speed Josephson digital integrated circuits. We have derived an analytical formula for the turn-on delay of the current-injection logic circuits, which is in good...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:J. Appl. Phys.; (United States) 1985-01, Vol.57 (11), p.5028-5035
1. Verfasser: SONE, J
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 5035
container_issue 11
container_start_page 5028
container_title J. Appl. Phys.; (United States)
container_volume 57
creator SONE, J
description A turn-on delay, during which the output voltage of a Josephson logic circuit is very small, is of prime interest for the design of high-speed Josephson digital integrated circuits. We have derived an analytical formula for the turn-on delay of the current-injection logic circuits, which is in good agreement with computer simulations. Analysis of the circuit equations shows that the nonlinear inductance of a current-summing Josephson junction plays an important role for the turn-on delay. Dependences of the turn-on delay on circuit parameters and operating conditions are calculated. For parameter values typical of 5-μm current-injection circuits, the turn-on delay is on the order of 10 ps. The turn-on delay and operating margin are compared in various types of current-injection logic circuits. The higher sensitivity of the threshold gate current to the input current is found to be desirable not only to reduce the turn-on delay but to operate in a wide margin.
doi_str_mv 10.1063/1.335279
format Article
fullrecord <record><control><sourceid>proquest_osti_</sourceid><recordid>TN_cdi_proquest_miscellaneous_24862249</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>24862249</sourcerecordid><originalsourceid>FETCH-LOGICAL-c314t-76c333d1b715fb47b114221a10eb414f4abab6c44de4aa6584deae818ff47aea3</originalsourceid><addsrcrecordid>eNo90E9LAzEQBfAgCtYq-BEWEfGyNbPJbrJHqf8peKnnMJtmbco2qZndQ7-9Ky2e5h1-PIbH2DXwGfBKPMBMiLJQ9QmbANd1rsqSn7IJ5wXkulb1Obsg2nAOoEU9YU_LIYU8hmzlOtxnGLDbk6cstpkdUnKhz33YONv70XxEcrs1jamL395m1ic7-J4u2VmLHbmr452yr5fn5fwtX3y-vs8fF7kVIPtcVVYIsYJGQdk2UjUAsigAgbtGgmwlNthUVsqVk4hVqceAToNuW6nQoZiym0NvpN4bsr53dm1jCON_plQaoIIR3R3QLsWfwVFvtp6s6zoMLg5kCqmropD1CO8P0KZIlFxrdslvMe0NcPO3pQFz2HKkt8dOJItdmzBYT_9ey6qspRa_dNRyuQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>24862249</pqid></control><display><type>article</type><title>Turn-on delay analysis of current-injection Josephson logic circuits</title><source>AIP Digital Archive</source><creator>SONE, J</creator><creatorcontrib>SONE, J ; Microelectronics Research Laboratories, NEC Corporation, Miyazaki, 4-1-1, Miyamae-ku, Kawasaki, Kanagawa 213, Japan</creatorcontrib><description>A turn-on delay, during which the output voltage of a Josephson logic circuit is very small, is of prime interest for the design of high-speed Josephson digital integrated circuits. We have derived an analytical formula for the turn-on delay of the current-injection logic circuits, which is in good agreement with computer simulations. Analysis of the circuit equations shows that the nonlinear inductance of a current-summing Josephson junction plays an important role for the turn-on delay. Dependences of the turn-on delay on circuit parameters and operating conditions are calculated. For parameter values typical of 5-μm current-injection circuits, the turn-on delay is on the order of 10 ps. The turn-on delay and operating margin are compared in various types of current-injection logic circuits. The higher sensitivity of the threshold gate current to the input current is found to be desirable not only to reduce the turn-on delay but to operate in a wide margin.</description><identifier>ISSN: 0021-8979</identifier><identifier>EISSN: 1089-7550</identifier><identifier>DOI: 10.1063/1.335279</identifier><identifier>CODEN: JAPIAU</identifier><language>eng</language><publisher>Woodbury, NY: American Institute of Physics</publisher><subject>420201 - Engineering- Cryogenic Equipment &amp; Devices ; 420800 - Engineering- Electronic Circuits &amp; Devices- (-1989) ; ANALYTICAL SOLUTION ; Applied sciences ; Circuit properties ; CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS ; COMPUTERIZED SIMULATION ; CURRENTS ; DATA ; DELAY CIRCUITS ; DESIGN ; DIGITAL CIRCUITS ; ELECTRIC CURRENTS ; ELECTRIC POTENTIAL ; Electric, optical and optoelectronic circuits ; ELECTRONIC CIRCUITS ; Electronics ; ENGINEERING ; Exact sciences and technology ; INFORMATION ; INTEGRATED CIRCUITS ; JOSEPHSON JUNCTIONS ; JUNCTIONS ; LOGIC CIRCUITS ; MICROELECTRONIC CIRCUITS ; NUMERICAL DATA ; OPERATION ; SENSITIVITY ; SIMULATION ; SUPERCONDUCTING JUNCTIONS ; THEORETICAL DATA ; THRESHOLD CURRENT ; TIME DELAY</subject><ispartof>J. Appl. Phys.; (United States), 1985-01, Vol.57 (11), p.5028-5035</ispartof><rights>1986 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c314t-76c333d1b715fb47b114221a10eb414f4abab6c44de4aa6584deae818ff47aea3</citedby><cites>FETCH-LOGICAL-c314t-76c333d1b715fb47b114221a10eb414f4abab6c44de4aa6584deae818ff47aea3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,881,27903,27904</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&amp;idt=8465948$$DView record in Pascal Francis$$Hfree_for_read</backlink><backlink>$$Uhttps://www.osti.gov/biblio/5781161$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>SONE, J</creatorcontrib><creatorcontrib>Microelectronics Research Laboratories, NEC Corporation, Miyazaki, 4-1-1, Miyamae-ku, Kawasaki, Kanagawa 213, Japan</creatorcontrib><title>Turn-on delay analysis of current-injection Josephson logic circuits</title><title>J. Appl. Phys.; (United States)</title><description>A turn-on delay, during which the output voltage of a Josephson logic circuit is very small, is of prime interest for the design of high-speed Josephson digital integrated circuits. We have derived an analytical formula for the turn-on delay of the current-injection logic circuits, which is in good agreement with computer simulations. Analysis of the circuit equations shows that the nonlinear inductance of a current-summing Josephson junction plays an important role for the turn-on delay. Dependences of the turn-on delay on circuit parameters and operating conditions are calculated. For parameter values typical of 5-μm current-injection circuits, the turn-on delay is on the order of 10 ps. The turn-on delay and operating margin are compared in various types of current-injection logic circuits. The higher sensitivity of the threshold gate current to the input current is found to be desirable not only to reduce the turn-on delay but to operate in a wide margin.</description><subject>420201 - Engineering- Cryogenic Equipment &amp; Devices</subject><subject>420800 - Engineering- Electronic Circuits &amp; Devices- (-1989)</subject><subject>ANALYTICAL SOLUTION</subject><subject>Applied sciences</subject><subject>Circuit properties</subject><subject>CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS</subject><subject>COMPUTERIZED SIMULATION</subject><subject>CURRENTS</subject><subject>DATA</subject><subject>DELAY CIRCUITS</subject><subject>DESIGN</subject><subject>DIGITAL CIRCUITS</subject><subject>ELECTRIC CURRENTS</subject><subject>ELECTRIC POTENTIAL</subject><subject>Electric, optical and optoelectronic circuits</subject><subject>ELECTRONIC CIRCUITS</subject><subject>Electronics</subject><subject>ENGINEERING</subject><subject>Exact sciences and technology</subject><subject>INFORMATION</subject><subject>INTEGRATED CIRCUITS</subject><subject>JOSEPHSON JUNCTIONS</subject><subject>JUNCTIONS</subject><subject>LOGIC CIRCUITS</subject><subject>MICROELECTRONIC CIRCUITS</subject><subject>NUMERICAL DATA</subject><subject>OPERATION</subject><subject>SENSITIVITY</subject><subject>SIMULATION</subject><subject>SUPERCONDUCTING JUNCTIONS</subject><subject>THEORETICAL DATA</subject><subject>THRESHOLD CURRENT</subject><subject>TIME DELAY</subject><issn>0021-8979</issn><issn>1089-7550</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1985</creationdate><recordtype>article</recordtype><recordid>eNo90E9LAzEQBfAgCtYq-BEWEfGyNbPJbrJHqf8peKnnMJtmbco2qZndQ7-9Ky2e5h1-PIbH2DXwGfBKPMBMiLJQ9QmbANd1rsqSn7IJ5wXkulb1Obsg2nAOoEU9YU_LIYU8hmzlOtxnGLDbk6cstpkdUnKhz33YONv70XxEcrs1jamL395m1ic7-J4u2VmLHbmr452yr5fn5fwtX3y-vs8fF7kVIPtcVVYIsYJGQdk2UjUAsigAgbtGgmwlNthUVsqVk4hVqceAToNuW6nQoZiym0NvpN4bsr53dm1jCON_plQaoIIR3R3QLsWfwVFvtp6s6zoMLg5kCqmropD1CO8P0KZIlFxrdslvMe0NcPO3pQFz2HKkt8dOJItdmzBYT_9ey6qspRa_dNRyuQ</recordid><startdate>19850101</startdate><enddate>19850101</enddate><creator>SONE, J</creator><general>American Institute of Physics</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope><scope>OTOTI</scope></search><sort><creationdate>19850101</creationdate><title>Turn-on delay analysis of current-injection Josephson logic circuits</title><author>SONE, J</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c314t-76c333d1b715fb47b114221a10eb414f4abab6c44de4aa6584deae818ff47aea3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1985</creationdate><topic>420201 - Engineering- Cryogenic Equipment &amp; Devices</topic><topic>420800 - Engineering- Electronic Circuits &amp; Devices- (-1989)</topic><topic>ANALYTICAL SOLUTION</topic><topic>Applied sciences</topic><topic>Circuit properties</topic><topic>CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS</topic><topic>COMPUTERIZED SIMULATION</topic><topic>CURRENTS</topic><topic>DATA</topic><topic>DELAY CIRCUITS</topic><topic>DESIGN</topic><topic>DIGITAL CIRCUITS</topic><topic>ELECTRIC CURRENTS</topic><topic>ELECTRIC POTENTIAL</topic><topic>Electric, optical and optoelectronic circuits</topic><topic>ELECTRONIC CIRCUITS</topic><topic>Electronics</topic><topic>ENGINEERING</topic><topic>Exact sciences and technology</topic><topic>INFORMATION</topic><topic>INTEGRATED CIRCUITS</topic><topic>JOSEPHSON JUNCTIONS</topic><topic>JUNCTIONS</topic><topic>LOGIC CIRCUITS</topic><topic>MICROELECTRONIC CIRCUITS</topic><topic>NUMERICAL DATA</topic><topic>OPERATION</topic><topic>SENSITIVITY</topic><topic>SIMULATION</topic><topic>SUPERCONDUCTING JUNCTIONS</topic><topic>THEORETICAL DATA</topic><topic>THRESHOLD CURRENT</topic><topic>TIME DELAY</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>SONE, J</creatorcontrib><creatorcontrib>Microelectronics Research Laboratories, NEC Corporation, Miyazaki, 4-1-1, Miyamae-ku, Kawasaki, Kanagawa 213, Japan</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics &amp; Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>OSTI.GOV</collection><jtitle>J. Appl. Phys.; (United States)</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>SONE, J</au><aucorp>Microelectronics Research Laboratories, NEC Corporation, Miyazaki, 4-1-1, Miyamae-ku, Kawasaki, Kanagawa 213, Japan</aucorp><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Turn-on delay analysis of current-injection Josephson logic circuits</atitle><jtitle>J. Appl. Phys.; (United States)</jtitle><date>1985-01-01</date><risdate>1985</risdate><volume>57</volume><issue>11</issue><spage>5028</spage><epage>5035</epage><pages>5028-5035</pages><issn>0021-8979</issn><eissn>1089-7550</eissn><coden>JAPIAU</coden><abstract>A turn-on delay, during which the output voltage of a Josephson logic circuit is very small, is of prime interest for the design of high-speed Josephson digital integrated circuits. We have derived an analytical formula for the turn-on delay of the current-injection logic circuits, which is in good agreement with computer simulations. Analysis of the circuit equations shows that the nonlinear inductance of a current-summing Josephson junction plays an important role for the turn-on delay. Dependences of the turn-on delay on circuit parameters and operating conditions are calculated. For parameter values typical of 5-μm current-injection circuits, the turn-on delay is on the order of 10 ps. The turn-on delay and operating margin are compared in various types of current-injection logic circuits. The higher sensitivity of the threshold gate current to the input current is found to be desirable not only to reduce the turn-on delay but to operate in a wide margin.</abstract><cop>Woodbury, NY</cop><pub>American Institute of Physics</pub><doi>10.1063/1.335279</doi><tpages>8</tpages></addata></record>
fulltext fulltext
identifier ISSN: 0021-8979
ispartof J. Appl. Phys.; (United States), 1985-01, Vol.57 (11), p.5028-5035
issn 0021-8979
1089-7550
language eng
recordid cdi_proquest_miscellaneous_24862249
source AIP Digital Archive
subjects 420201 - Engineering- Cryogenic Equipment & Devices
420800 - Engineering- Electronic Circuits & Devices- (-1989)
ANALYTICAL SOLUTION
Applied sciences
Circuit properties
CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS
COMPUTERIZED SIMULATION
CURRENTS
DATA
DELAY CIRCUITS
DESIGN
DIGITAL CIRCUITS
ELECTRIC CURRENTS
ELECTRIC POTENTIAL
Electric, optical and optoelectronic circuits
ELECTRONIC CIRCUITS
Electronics
ENGINEERING
Exact sciences and technology
INFORMATION
INTEGRATED CIRCUITS
JOSEPHSON JUNCTIONS
JUNCTIONS
LOGIC CIRCUITS
MICROELECTRONIC CIRCUITS
NUMERICAL DATA
OPERATION
SENSITIVITY
SIMULATION
SUPERCONDUCTING JUNCTIONS
THEORETICAL DATA
THRESHOLD CURRENT
TIME DELAY
title Turn-on delay analysis of current-injection Josephson logic circuits
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-28T06%3A56%3A13IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_osti_&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Turn-on%20delay%20analysis%20of%20current-injection%20Josephson%20logic%20circuits&rft.jtitle=J.%20Appl.%20Phys.;%20(United%20States)&rft.au=SONE,%20J&rft.aucorp=Microelectronics%20Research%20Laboratories,%20NEC%20Corporation,%20Miyazaki,%204-1-1,%20Miyamae-ku,%20Kawasaki,%20Kanagawa%20213,%20Japan&rft.date=1985-01-01&rft.volume=57&rft.issue=11&rft.spage=5028&rft.epage=5035&rft.pages=5028-5035&rft.issn=0021-8979&rft.eissn=1089-7550&rft.coden=JAPIAU&rft_id=info:doi/10.1063/1.335279&rft_dat=%3Cproquest_osti_%3E24862249%3C/proquest_osti_%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=24862249&rft_id=info:pmid/&rfr_iscdi=true