Tilt grain boundaries in NiO

Tilt grain boundaries in NiO

High-resolution Electron Microscopy (HREM) show that crystallinity is maintained right up to the interface in a high-purity NiO 〈001〉 tilt grain boundary (GB). The strong Fresnel contrast effects that are found in high-angle NiO GBs by both conventional TEM and HREM are largely due to a locally redu...

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Veröffentlicht in:Ultramicroscopy 1985-01, Vol.18 (1), p.281-284
Hauptverfasser: Merkle, K.L., Reddy, J.F., Wiley, C.L.
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container_title Ultramicroscopy
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creator Merkle, K.L.
Reddy, J.F.
Wiley, C.L.
description High-resolution Electron Microscopy (HREM) show that crystallinity is maintained right up to the interface in a high-purity NiO 〈001〉 tilt grain boundary (GB). The strong Fresnel contrast effects that are found in high-angle NiO GBs by both conventional TEM and HREM are largely due to a locally reduced atomic density at the GB and are not caused by the presence of an amorphous phase. The HREM micrographs indicate several atomic-scale GB features.
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