Surface topography effects on energy-resolved polar angular distributions of ion-induced secondary electrons

From two models of surfaces modified by ion bombardment, polar angular distributions of electrons isotropically generated both inside and outside the crystal were calculated for different roughness parameters and various incidence angles. Under normal incidence, the angular distributions of electron...

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Veröffentlicht in:Surface science 1985-11, Vol.163 (2), p.L720-L729
Hauptverfasser: Banouni, M., Mischler, J., Negre, M., Benazeth, N.
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container_end_page L729
container_issue 2
container_start_page L720
container_title Surface science
container_volume 163
creator Banouni, M.
Mischler, J.
Negre, M.
Benazeth, N.
description From two models of surfaces modified by ion bombardment, polar angular distributions of electrons isotropically generated both inside and outside the crystal were calculated for different roughness parameters and various incidence angles. Under normal incidence, the angular distributions of electrons excited inside the solid follow a cosine law. For electrons generated outside the solid, but at a distance from the surface less than the depth of the surface depressions, the topographical modifications alter the expected constant polar angular distribution. A decreasing law was observed from a threshold value depending on the value of the roughness parameter. This preliminary work shows that previous results concerning polar angular distributions of Auger electrons belonging to the atomic-like lines observed in ion-induced Al L 23 Auger spectra have to be considered again taking into account the effect of surface texture.
doi_str_mv 10.1016/0039-6028(85)91051-9
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source Elsevier ScienceDirect Journals
subjects Applied sciences
Cross-disciplinary physics: materials science
rheology
Exact sciences and technology
Materials science
Metals, semimetals and alloys
Metals. Metallurgy
Other surface treatments
Physics
Production techniques
Specific materials
Surface treatment
title Surface topography effects on energy-resolved polar angular distributions of ion-induced secondary electrons
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