Observation of a resonant enhancement of microwave radiation from a gas-filled backward wave oscillator
High-power microwave radiation at 8 GHz from a gas-filled backward wave oscillator driven by an intense relativistic electron beam has been measured. It has been observed that an order of magnitude resonant increase in microwave output power occurs at a particular pressure of the background gas. Thi...
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| Veröffentlicht in: | Applied physics letters 1988-08, Vol.53 (7), p.559-561 |
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| container_end_page | 561 |
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| container_issue | 7 |
| container_start_page | 559 |
| container_title | Applied physics letters |
| container_volume | 53 |
| creator | MINAMI, K LOU, W. R DESTLER, W. W KEHS, R. A GRANATSTEIN, V. L CARMEL, Y |
| description | High-power microwave radiation at 8 GHz from a gas-filled backward wave oscillator driven by an intense relativistic electron beam has been measured. It has been observed that an order of magnitude resonant increase in microwave output power occurs at a particular pressure of the background gas. This resonance has also been observed to be strongly dependent on the value of applied axial magnetic field. Possible explanations for the observed results are discussed. |
| doi_str_mv | 10.1063/1.99856 |
| format | Article |
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Possible explanations for the observed results are discussed.</description><identifier>ISSN: 0003-6951</identifier><identifier>EISSN: 1077-3118</identifier><identifier>DOI: 10.1063/1.99856</identifier><identifier>CODEN: APPLAB</identifier><language>eng</language><publisher>Melville, NY: American Institute of Physics</publisher><subject>Applied sciences ; Circuit properties ; Electric, optical and optoelectronic circuits ; Electronics ; Exact sciences and technology ; Optical and optoelectronic circuits</subject><ispartof>Applied physics letters, 1988-08, Vol.53 (7), p.559-561</ispartof><rights>1989 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c349t-feb5dbf51f5b5b3ed617bc927eec3d674685d4f83959d88a14ea13f76db5c94d3</citedby><cites>FETCH-LOGICAL-c349t-feb5dbf51f5b5b3ed617bc927eec3d674685d4f83959d88a14ea13f76db5c94d3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=7369190$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>MINAMI, K</creatorcontrib><creatorcontrib>LOU, W. 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Possible explanations for the observed results are discussed.</description><subject>Applied sciences</subject><subject>Circuit properties</subject><subject>Electric, optical and optoelectronic circuits</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Optical and optoelectronic circuits</subject><issn>0003-6951</issn><issn>1077-3118</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1988</creationdate><recordtype>article</recordtype><recordid>eNo9kMtOwzAQRS0EEqUgfiELBKsUu46deIkqCkiVuoF1NLbHJZDExU5b8fe4D7Ga15mrmUvILaMTRiV_ZBOlKiHPyIjRssw5Y9U5GVFKeS6VYJfkKsavVIop5yOyWuqIYQtD4_vMuwyygNH30A8Z9p_QG-ww5WnSNSb4HWwxC2Cb44ILvksrK4i5a9oWbabBfO8g2OxA-mhSGwYfrsmFgzbizSmOycf8-X32mi-WL2-zp0VueKGG3KEWVjvBnNBCc7SSldqoaYlouJVlISthC1dxJZStKmAFAuOulFYLowrLx-T-qLsO_meDcai7JhpMR_ToN7GeFhXbP5_AhyOYvooxoKvXoekg_NaM1nsja1YfjEzk3UkSooHWheRKE__xkkvFFOV_huZzwA</recordid><startdate>19880815</startdate><enddate>19880815</enddate><creator>MINAMI, K</creator><creator>LOU, W. 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L ; CARMEL, Y</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c349t-feb5dbf51f5b5b3ed617bc927eec3d674685d4f83959d88a14ea13f76db5c94d3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1988</creationdate><topic>Applied sciences</topic><topic>Circuit properties</topic><topic>Electric, optical and optoelectronic circuits</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Optical and optoelectronic circuits</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>MINAMI, K</creatorcontrib><creatorcontrib>LOU, W. R</creatorcontrib><creatorcontrib>DESTLER, W. W</creatorcontrib><creatorcontrib>KEHS, R. A</creatorcontrib><creatorcontrib>GRANATSTEIN, V. 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| fulltext | fulltext |
| identifier | ISSN: 0003-6951 |
| ispartof | Applied physics letters, 1988-08, Vol.53 (7), p.559-561 |
| issn | 0003-6951 1077-3118 |
| language | eng |
| recordid | cdi_proquest_miscellaneous_24810005 |
| source | AIP Digital Archive |
| subjects | Applied sciences Circuit properties Electric, optical and optoelectronic circuits Electronics Exact sciences and technology Optical and optoelectronic circuits |
| title | Observation of a resonant enhancement of microwave radiation from a gas-filled backward wave oscillator |
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