Auxiliary interferometer in an optoelectronic swept-frequency laser and its application to the measurement of the group refractive index
An optoelectronic swept-frequency laser (SFL) is an optoelectronic feedback system that includes an auxiliary interferometer that can exert precise control over the optical frequency sweep. The arm-length difference (ALD) of the auxiliary interferometer directly affects the performance of the whole...
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| Veröffentlicht in: | Applied optics (2004) 2020-11, Vol.59 (33), p.10294-10303 |
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| container_issue | 33 |
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| container_title | Applied optics (2004) |
| container_volume | 59 |
| creator | Zhao, Enming Shen, Heliang Liu, Shuangqiang Liu, Guangyu Zhou, Bao Wang, Chen Xing, Chuanxi Miao, Peixian Shi, Yanchao |
| description | An optoelectronic swept-frequency laser (SFL) is an optoelectronic feedback system that includes an auxiliary interferometer that can exert precise control over the optical frequency sweep. The arm-length difference (ALD) of the auxiliary interferometer directly affects the performance of the whole system. We established a theoretical model to choose the optimal ALD of an auxiliary interferometer in an optoelectronic SFL system using a frequency-modulated continuous-wave reflectometry experimental setup. The experimental results indicated that, based on our system, the optimal ALD was 7 m, which agreed with the theoretical analysis. As an example application, we implemented the proposed system for measurement of the group refractive index of a glass sample. A minimum measurement error of 0.12% was obtained with the ALD of 7 m. |
| doi_str_mv | 10.1364/AO.402420 |
| format | Article |
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The arm-length difference (ALD) of the auxiliary interferometer directly affects the performance of the whole system. We established a theoretical model to choose the optimal ALD of an auxiliary interferometer in an optoelectronic SFL system using a frequency-modulated continuous-wave reflectometry experimental setup. The experimental results indicated that, based on our system, the optimal ALD was 7 m, which agreed with the theoretical analysis. As an example application, we implemented the proposed system for measurement of the group refractive index of a glass sample. 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The arm-length difference (ALD) of the auxiliary interferometer directly affects the performance of the whole system. We established a theoretical model to choose the optimal ALD of an auxiliary interferometer in an optoelectronic SFL system using a frequency-modulated continuous-wave reflectometry experimental setup. The experimental results indicated that, based on our system, the optimal ALD was 7 m, which agreed with the theoretical analysis. As an example application, we implemented the proposed system for measurement of the group refractive index of a glass sample. 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The arm-length difference (ALD) of the auxiliary interferometer directly affects the performance of the whole system. We established a theoretical model to choose the optimal ALD of an auxiliary interferometer in an optoelectronic SFL system using a frequency-modulated continuous-wave reflectometry experimental setup. The experimental results indicated that, based on our system, the optimal ALD was 7 m, which agreed with the theoretical analysis. As an example application, we implemented the proposed system for measurement of the group refractive index of a glass sample. A minimum measurement error of 0.12% was obtained with the ALD of 7 m.</abstract><cop>United States</cop><pub>Optical Society of America</pub><pmid>33361961</pmid><doi>10.1364/AO.402420</doi><tpages>10</tpages><orcidid>https://orcid.org/0000-0003-3356-3005</orcidid></addata></record> |
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| ispartof | Applied optics (2004), 2020-11, Vol.59 (33), p.10294-10303 |
| issn | 1559-128X 2155-3165 1539-4522 |
| language | eng |
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| source | Alma/SFX Local Collection; Optica Publishing Group Journals |
| subjects | Continuous radiation Error analysis Optical frequency Optoelectronics Refractivity |
| title | Auxiliary interferometer in an optoelectronic swept-frequency laser and its application to the measurement of the group refractive index |
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