A Study of Electric-Field Breakdown in E-Plane Lines at Centimeter and Millimeter Wavelengths
The microwave field breakdown in various E-plane transmission lines is investigated theoretically in the frequency range from 1 to 140 GHz. The influence of frequency, pressure, temperature, and inhomogeneity of the applied field on the breakdowm field value is discussed. The peak power-handling cap...
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| Veröffentlicht in: | IEEE transactions on microwave theory and techniques 1987-05, Vol.35 (5), p.502-509 |
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| container_title | IEEE transactions on microwave theory and techniques |
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| creator | Ney, M.M. Valluri, S.R. Yue, W. Costache, G.I. Hoefer, W.J.R. |
| description | The microwave field breakdown in various E-plane transmission lines is investigated theoretically in the frequency range from 1 to 140 GHz. The influence of frequency, pressure, temperature, and inhomogeneity of the applied field on the breakdowm field value is discussed. The peak power-handling capability of unilateral and bilateral finlines is determined theoretically using a quasi-static evaluation of the field distribution. It is found that finlines, even with small gap widths, can handle pulse power levels well above the capability of present solid-state devices. Preliminary breakdown measurements in X-band have confirmed the validity of the theoretical predictions. |
| doi_str_mv | 10.1109/TMTT.1987.1133690 |
| format | Article |
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The influence of frequency, pressure, temperature, and inhomogeneity of the applied field on the breakdowm field value is discussed. The peak power-handling capability of unilateral and bilateral finlines is determined theoretically using a quasi-static evaluation of the field distribution. It is found that finlines, even with small gap widths, can handle pulse power levels well above the capability of present solid-state devices. 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The influence of frequency, pressure, temperature, and inhomogeneity of the applied field on the breakdowm field value is discussed. The peak power-handling capability of unilateral and bilateral finlines is determined theoretically using a quasi-static evaluation of the field distribution. It is found that finlines, even with small gap widths, can handle pulse power levels well above the capability of present solid-state devices. Preliminary breakdown measurements in X-band have confirmed the validity of the theoretical predictions.</description><subject>Applied sciences</subject><subject>Circuit properties</subject><subject>Dielectric breakdown</subject><subject>Dielectric losses</subject><subject>Dielectric substrates</subject><subject>Electric breakdown</subject><subject>Electric, optical and optoelectronic circuits</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Frequency</subject><subject>Microwave circuits, microwave integrated circuits, microwave transmission lines, submillimeter wave circuits</subject><subject>Millimeter wave technology</subject><subject>Nonuniform electric fields</subject><subject>Power engineering computing</subject><subject>Solid state circuits</subject><subject>Temperature</subject><issn>0018-9480</issn><issn>1557-9670</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1987</creationdate><recordtype>article</recordtype><recordid>eNqNkU1LxDAQhoMouH78APGSg3irTtI2TY-67KqwouCKJymz7USj2VaTruK_t2WLHvUUXnjmYTIvYwcCToSA_HR-PZ-fiFxnXYxjlcMGG4k0zaJcZbDJRgBCR3miYZvthPDSxSQFPWKPZ_yuXVVfvDF84qhsvS2jqSVX8XNP-Fo1nzW3NZ9Etw5r4jNbU-DY8jHVrV1SS55jXfFr69wQH_CDHNVP7XPYY1sGXaD94d1l99PJfHwZzW4ursZns6iMddpGBgyaBUrsPqAldJst4py0EgS5XBhESIzONKAqBRglMEalZBrLRaKqTEC8y47X3jffvK8otMXShpJcv3KzCoXUSoruEn-DSacTIv0PCHmS9aBYg6VvQvBkijdvl-i_CgFFX03RV1P01RRDNd3M0SDHUKIzHuvShp9BHUuVgOywwzVmiehXO0i-AU6AlZQ</recordid><startdate>19870501</startdate><enddate>19870501</enddate><creator>Ney, M.M.</creator><creator>Valluri, S.R.</creator><creator>Yue, W.</creator><creator>Costache, G.I.</creator><creator>Hoefer, W.J.R.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope><scope>H8D</scope></search><sort><creationdate>19870501</creationdate><title>A Study of Electric-Field Breakdown in E-Plane Lines at Centimeter and Millimeter Wavelengths</title><author>Ney, M.M. ; Valluri, S.R. ; Yue, W. ; Costache, G.I. ; Hoefer, W.J.R.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c385t-f0fafba2a198820450b39e861e092bfaa04f8780a6c10f61a3a662532b46d7103</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1987</creationdate><topic>Applied sciences</topic><topic>Circuit properties</topic><topic>Dielectric breakdown</topic><topic>Dielectric losses</topic><topic>Dielectric substrates</topic><topic>Electric breakdown</topic><topic>Electric, optical and optoelectronic circuits</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Frequency</topic><topic>Microwave circuits, microwave integrated circuits, microwave transmission lines, submillimeter wave circuits</topic><topic>Millimeter wave technology</topic><topic>Nonuniform electric fields</topic><topic>Power engineering computing</topic><topic>Solid state circuits</topic><topic>Temperature</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Ney, M.M.</creatorcontrib><creatorcontrib>Valluri, S.R.</creatorcontrib><creatorcontrib>Yue, W.</creatorcontrib><creatorcontrib>Costache, G.I.</creatorcontrib><creatorcontrib>Hoefer, W.J.R.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Aerospace Database</collection><jtitle>IEEE transactions on microwave theory and techniques</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Ney, M.M.</au><au>Valluri, S.R.</au><au>Yue, W.</au><au>Costache, G.I.</au><au>Hoefer, W.J.R.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>A Study of Electric-Field Breakdown in E-Plane Lines at Centimeter and Millimeter Wavelengths</atitle><jtitle>IEEE transactions on microwave theory and techniques</jtitle><stitle>TMTT</stitle><date>1987-05-01</date><risdate>1987</risdate><volume>35</volume><issue>5</issue><spage>502</spage><epage>509</epage><pages>502-509</pages><issn>0018-9480</issn><eissn>1557-9670</eissn><coden>IETMAB</coden><abstract>The microwave field breakdown in various E-plane transmission lines is investigated theoretically in the frequency range from 1 to 140 GHz. The influence of frequency, pressure, temperature, and inhomogeneity of the applied field on the breakdowm field value is discussed. The peak power-handling capability of unilateral and bilateral finlines is determined theoretically using a quasi-static evaluation of the field distribution. It is found that finlines, even with small gap widths, can handle pulse power levels well above the capability of present solid-state devices. Preliminary breakdown measurements in X-band have confirmed the validity of the theoretical predictions.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/TMTT.1987.1133690</doi><tpages>8</tpages></addata></record> |
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| ispartof | IEEE transactions on microwave theory and techniques, 1987-05, Vol.35 (5), p.502-509 |
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| language | eng |
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| source | IEEE Electronic Library (IEL) |
| subjects | Applied sciences Circuit properties Dielectric breakdown Dielectric losses Dielectric substrates Electric breakdown Electric, optical and optoelectronic circuits Electronics Exact sciences and technology Frequency Microwave circuits, microwave integrated circuits, microwave transmission lines, submillimeter wave circuits Millimeter wave technology Nonuniform electric fields Power engineering computing Solid state circuits Temperature |
| title | A Study of Electric-Field Breakdown in E-Plane Lines at Centimeter and Millimeter Wavelengths |
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