Lattice defects within grain volumes that affect the electrical quality of cast polycrystalline silicon solar-cell materials

Lattice defect structures within large grains of cast polycrystalline silicon have been investigated using optical microscopy, x-ray topography, and electron-beam-induced conductivity (EBIC) measurements. Optical observations through a series of wafers of an ingot indicate that kinks in high-angle g...

Ausführliche Beschreibung