Domain inversion effects in Ti-LiNbO3 integrated optical devices

Significant degradation in the cumulative electro-optic effect attributable to domain inversion has been observed in integrated optical devices fabricated by Ti diffusion in c+-LiNbO3. The c− surface was found to be considerably more immune to domain inversion than the c+ surface under similar diffu...

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Veröffentlicht in:	Applied physics letters 1985-05, Vol.46 (10), p.933-935
Hauptverfasser:	THANIYAVARN, S, FINDAKLY, T, BOOHER, D, MOEN, J
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences Circuit properties Electric, optical and optoelectronic circuits Electronics Exact sciences and technology Miscellaneous Optical and optoelectronic circuits
Online-Zugang:	Volltext
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