Enhancement of superconductivity by quasiparticle injection. I: Model analysis

Nonequilibrium phenomena in the two electrodes of high-current-density superconducting tunnel junctions are analyzed. The quasiparticle injection-induced enhancement of the energy gaps as well as of the critical current of one of the electrodes are considered. A graphic approach is employed to solve...

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Veröffentlicht in:	J. Low Temp. Phys.; (United States) 1987-11, Vol.69 (3-4), p.265-286
Hauptverfasser:	VAN DEN HAMER, P, MONTIE, E. A, MOOIJ, J. E, KLAPWIJK, T. M
Format:	Artikel
Sprache:	eng
Schlagworte:	656100 - Condensed Matter Physics- Superconductivity CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY Condensed matter: electronic structure, electrical, magnetic, and optical properties CRITICAL CURRENT Cross-disciplinary physics: materials science rheology CURRENT DENSITY CURRENTS ELECTRIC CONDUCTIVITY ELECTRIC CURRENTS ELECTRICAL PROPERTIES ELECTRODES ENERGY GAP ENERGY LEVELS EQUILIBRIUM Exact sciences and technology EXCITED STATES GINZBURG-LANDAU THEORY INJECTION INTAKE JUNCTIONS Materials science MATHEMATICAL MODELS Metals, alloys and compounds (a15, 001c15, laves phases, chevrel phases, borocarbides, etc.) Metals, semimetals and alloys METASTABLE STATES OPTIMIZATION PHYSICAL PROPERTIES Physics Proximity effects, weak links, tunneling phenomena, and josephson effects, adreev effect, sn and sns junctions QUASI PARTICLES Specific materials SUPERCONDUCTING JUNCTIONS Superconducting materials (excluding high-tc compounds) SUPERCONDUCTIVITY TUNNEL EFFECT
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Beschreibung
Zusammenfassung:	Nonequilibrium phenomena in the two electrodes of high-current-density superconducting tunnel junctions are analyzed. The quasiparticle injection-induced enhancement of the energy gaps as well as of the critical current of one of the electrodes are considered. A graphic approach is employed to solve the coupled gap equations for both films. Multiple-gap states are found at voltages close to the sum and difference of the two gaps.
ISSN:	0022-2291 1573-7357
DOI:	10.1007/BF00682662