Comparative study of radiotracer and secondary-ion mass spectrometry profiling of gold diffused Cd(x)Hg(1-x)Te

Radiotracer and secondary-ion mass spectrometry (SIMS) diffusion profiling techniques in Cd(x)Hg(1-x)Te (CMT) have been compared in order to provide a sounder basis for dopant characterization in this material. Au diffusion profiles were determined by the radiotracer and SIMS techniques after a diff...

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Veröffentlicht in:	Journal of applied physics 1985-08, Vol.58, p.1404-1406
Hauptverfasser:	Palfrey, H D, Blackmore, G W, Courtney, S J
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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