Dynamic parallel phase-shifting electronic speckle pattern interferometer

Methods for measuring variations in diffuse surfaces using electronic speckle pattern interferometry (ESPI) are widely used and well known. In this research, we present an out-of-plane ESPI system coupled to a Michelson configuration to generate simultaneous parallel interferograms with different ph...

Ausführliche Beschreibung

Bibliographische Detailangaben

Veröffentlicht in:	Applied optics (2004) 2020-09, Vol.59 (27), p.8160-8166
Hauptverfasser:	Toto-Arellano, Noel-Ivan, Gómez-Méndez, Gustavo A., Martínez-García, Amalia, Otani, Yukitoshi, Serrano-García, David I., Antonio Rayas, Juan, Rodríguez-Zurita, Gustavo, García-Lechuga, Luis
Format:	Artikel
Sprache:	eng
Schlagworte:	Aluminum Circular polarization Electronic speckle pattern interferometry Interferometry Measurement methods Metal plates Polarization modulation Speckle patterns
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!