Dynamic parallel phase-shifting electronic speckle pattern interferometer

Methods for measuring variations in diffuse surfaces using electronic speckle pattern interferometry (ESPI) are widely used and well known. In this research, we present an out-of-plane ESPI system coupled to a Michelson configuration to generate simultaneous parallel interferograms with different ph...

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Veröffentlicht in:Applied optics (2004) 2020-09, Vol.59 (27), p.8160-8166
Hauptverfasser: Toto-Arellano, Noel-Ivan, Gómez-Méndez, Gustavo A., Martínez-García, Amalia, Otani, Yukitoshi, Serrano-García, David I., Antonio Rayas, Juan, Rodríguez-Zurita, Gustavo, García-Lechuga, Luis
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container_end_page 8166
container_issue 27
container_start_page 8160
container_title Applied optics (2004)
container_volume 59
creator Toto-Arellano, Noel-Ivan
Gómez-Méndez, Gustavo A.
Martínez-García, Amalia
Otani, Yukitoshi
Serrano-García, David I.
Antonio Rayas, Juan
Rodríguez-Zurita, Gustavo
García-Lechuga, Luis
description Methods for measuring variations in diffuse surfaces using electronic speckle pattern interferometry (ESPI) are widely used and well known. In this research, we present an out-of-plane ESPI system coupled to a Michelson configuration to generate simultaneous parallel interferograms with different phase shifts. The system uses circular polarization states to generate parallel phase shifted interferograms. Due to the polarization states, the fringes do not experience a contrast reduction, thus avoiding measurement errors that affect spatial or temporal phase-shifting in interferometry. The basic operating principle of polarization modulation is described, and results that represent the temporal evolution of an aluminum plate are presented. The generation of two simultaneous patterns allows one to track the dynamic performance of the plate.
doi_str_mv 10.1364/AO.401309
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source Alma/SFX Local Collection; Optica Publishing Group Journals
subjects Aluminum
Circular polarization
Electronic speckle pattern interferometry
Interferometry
Measurement methods
Metal plates
Polarization modulation
Speckle patterns
title Dynamic parallel phase-shifting electronic speckle pattern interferometer
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