Confirmation by SQUID magnetometry of FMR measurements of magnetization of ultrathin Fe-B amorphous films
Direct measurements were made by means of SQUID magnetometry of the magnetization of ultrathin Fe50B50 and Fe70B30 amorphous films at room temperature. The film thicknesses used included most of those investigated in the authors’ recent ferromagnetic resonance (FMR) determinations of the surface ani...
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Veröffentlicht in: | Journal of applied physics 1987-04, Vol.61 (8), p.4265-4266 |
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creator | ZHANG, L RADO, G. T |
description | Direct measurements were made by means of SQUID magnetometry of the magnetization of ultrathin Fe50B50 and Fe70B30 amorphous films at room temperature. The film thicknesses used included most of those investigated in the authors’ recent ferromagnetic resonance (FMR) determinations of the surface anisotropy Ks and the magnetization M of such films. The directly measured values of M confirm adequately the M values obtained by computer fitting of a theory to experimental FMR data. Thus, the present experiments offer substantial support for the reliability of the FMR method for measurements of Ks and M in ultrathin films. |
doi_str_mv | 10.1063/1.338467 |
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T</creator><creatorcontrib>ZHANG, L ; RADO, G. T</creatorcontrib><description>Direct measurements were made by means of SQUID magnetometry of the magnetization of ultrathin Fe50B50 and Fe70B30 amorphous films at room temperature. The film thicknesses used included most of those investigated in the authors’ recent ferromagnetic resonance (FMR) determinations of the surface anisotropy Ks and the magnetization M of such films. The directly measured values of M confirm adequately the M values obtained by computer fitting of a theory to experimental FMR data. Thus, the present experiments offer substantial support for the reliability of the FMR method for measurements of Ks and M in ultrathin films.</description><identifier>ISSN: 0021-8979</identifier><identifier>EISSN: 1089-7550</identifier><identifier>DOI: 10.1063/1.338467</identifier><identifier>CODEN: JAPIAU</identifier><language>eng</language><publisher>Woodbury, NY: American Institute of Physics</publisher><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties ; Cross-disciplinary physics: materials science; rheology ; Exact sciences and technology ; Magnetic properties and materials ; Magnetic properties of surface, thin films and multilayers ; Materials science ; Metals, semimetals and alloys ; Physics ; Specific materials</subject><ispartof>Journal of applied physics, 1987-04, Vol.61 (8), p.4265-4266</ispartof><rights>1988 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c287t-8b11239e505e8b0c591014126c4db98493d2ca1fb10f0dca993e497fcd8c7daf3</citedby><cites>FETCH-LOGICAL-c287t-8b11239e505e8b0c591014126c4db98493d2ca1fb10f0dca993e497fcd8c7daf3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>309,310,314,780,784,789,790,23930,23931,25140,27924,27925</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=7413296$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>ZHANG, L</creatorcontrib><creatorcontrib>RADO, G. T</creatorcontrib><title>Confirmation by SQUID magnetometry of FMR measurements of magnetization of ultrathin Fe-B amorphous films</title><title>Journal of applied physics</title><description>Direct measurements were made by means of SQUID magnetometry of the magnetization of ultrathin Fe50B50 and Fe70B30 amorphous films at room temperature. The film thicknesses used included most of those investigated in the authors’ recent ferromagnetic resonance (FMR) determinations of the surface anisotropy Ks and the magnetization M of such films. The directly measured values of M confirm adequately the M values obtained by computer fitting of a theory to experimental FMR data. Thus, the present experiments offer substantial support for the reliability of the FMR method for measurements of Ks and M in ultrathin films.</description><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties</subject><subject>Cross-disciplinary physics: materials science; rheology</subject><subject>Exact sciences and technology</subject><subject>Magnetic properties and materials</subject><subject>Magnetic properties of surface, thin films and multilayers</subject><subject>Materials science</subject><subject>Metals, semimetals and alloys</subject><subject>Physics</subject><subject>Specific materials</subject><issn>0021-8979</issn><issn>1089-7550</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1987</creationdate><recordtype>article</recordtype><recordid>eNo9kE1LAzEYhIMoWKvgT8hBxMvWvJv9SI5arRYq4kfPSzab2MhmU5Psof56t2zxNDA8MwyD0CWQGZCC3sKMUpYV5RGaAGE8KfOcHKMJISkkjJf8FJ2F8E0IAKN8gszcddp4K6JxHa53-ONtvXzAVnx1Kjqrot9hp_Hi5R1bJULvlVVdDHtvZMzvGB2Mvo1exI3p8EIl91hY57cb1wesTWvDOTrRog3q4qBTtF48fs6fk9Xr03J-t0pkysqYsBogpVzlJFesJjLnQCCDtJBZU3OWcdqkUoCugWjSSME5VRkvtWyYLBuh6RRdj71b7356FWJlTZCqbUWnhjFVmlFOc8IG8GYEpXcheKWrrTdW-F0FpNp_WUE1fjmgV4dOEaRotRedNOGfLzOgKS_oHxf6c6o</recordid><startdate>19870415</startdate><enddate>19870415</enddate><creator>ZHANG, L</creator><creator>RADO, G. 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T</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c287t-8b11239e505e8b0c591014126c4db98493d2ca1fb10f0dca993e497fcd8c7daf3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1987</creationdate><topic>Condensed matter: electronic structure, electrical, magnetic, and optical properties</topic><topic>Cross-disciplinary physics: materials science; rheology</topic><topic>Exact sciences and technology</topic><topic>Magnetic properties and materials</topic><topic>Magnetic properties of surface, thin films and multilayers</topic><topic>Materials science</topic><topic>Metals, semimetals and alloys</topic><topic>Physics</topic><topic>Specific materials</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>ZHANG, L</creatorcontrib><creatorcontrib>RADO, G. 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T</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Confirmation by SQUID magnetometry of FMR measurements of magnetization of ultrathin Fe-B amorphous films</atitle><jtitle>Journal of applied physics</jtitle><date>1987-04-15</date><risdate>1987</risdate><volume>61</volume><issue>8</issue><spage>4265</spage><epage>4266</epage><pages>4265-4266</pages><issn>0021-8979</issn><eissn>1089-7550</eissn><coden>JAPIAU</coden><abstract>Direct measurements were made by means of SQUID magnetometry of the magnetization of ultrathin Fe50B50 and Fe70B30 amorphous films at room temperature. The film thicknesses used included most of those investigated in the authors’ recent ferromagnetic resonance (FMR) determinations of the surface anisotropy Ks and the magnetization M of such films. The directly measured values of M confirm adequately the M values obtained by computer fitting of a theory to experimental FMR data. Thus, the present experiments offer substantial support for the reliability of the FMR method for measurements of Ks and M in ultrathin films.</abstract><cop>Woodbury, NY</cop><pub>American Institute of Physics</pub><doi>10.1063/1.338467</doi><tpages>2</tpages></addata></record> |
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subjects | Condensed matter: electronic structure, electrical, magnetic, and optical properties Cross-disciplinary physics: materials science rheology Exact sciences and technology Magnetic properties and materials Magnetic properties of surface, thin films and multilayers Materials science Metals, semimetals and alloys Physics Specific materials |
title | Confirmation by SQUID magnetometry of FMR measurements of magnetization of ultrathin Fe-B amorphous films |
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