Influence of grain boundaries and surface Debye temperature on the electrical resistance of thin gold films
The electrical resistivity of thin Au films deposited on amorphous substrates is found to increase with decreasing film thickness. The temp.-dependent part of the resistivity, however, is independent of the film thickness. This observation cannot be reconciled with existing theories that deal with s...
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| Veröffentlicht in: | Physical review. B, Condensed matter Condensed matter, 1984-01, Vol.29 (2), p.645-650 |
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| container_end_page | 650 |
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| container_issue | 2 |
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| container_title | Physical review. B, Condensed matter |
| container_volume | 29 |
| creator | VAN ATTEKUM, P. M. T. M WOERLEE, P. H VERKADE, G. C HOEBEN, A. A. M |
| description | The electrical resistivity of thin Au films deposited on amorphous substrates is found to increase with decreasing film thickness. The temp.-dependent part of the resistivity, however, is independent of the film thickness. This observation cannot be reconciled with existing theories that deal with surface scattering effects. Electron scattering at grain boundaries is shown to explain the measurements. Moreover, the main effect of the surface appears to be a change in the effective Debye temp. 14 ref.--AA |
| doi_str_mv | 10.1103/physrevb.29.645 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_24292480</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>24292480</sourcerecordid><originalsourceid>FETCH-LOGICAL-c365t-adad6323bdbc8842b9508a913f98e33b4bd2ccb0ceb08b671add4aa8b66d78cf3</originalsourceid><addsrcrecordid>eNo9kM1LAzEQxYMoWKtnrzmIt23zsbvdHLV-FQqK6HmZJJN2db9Mdgv97420OJcZmPcevB8h15zNOGdy3m_3weNOz4Sa5Wl2QiacqSyRC5WdkgnjuUx4IdQ5uQjhi8URuZqQ71Xr6hFbg7RzdOOhaqnuxtaCrzBQaC0No3cQ_w-o90gHbHr0MIw-Olo6bJFijWbwlYGaegxVGOAYN2xj2qarLXVV3YRLcuagDnh13FPy-fT4sXxJ1q_Pq-XdOjEyz4YELNhcCqmtNkWRCq0yVoDi0qkCpdSptsIYzQxqVuh8wcHaFCCeuV0UxskpuT3k9r77GTEMZVMFg3UNLXZjKEUqlEgLFoXzg9D4LkR4rux91YDfl5yVf1DLtwj1HXf3pVBlhBodN8doCLGv87FqFf5tasFSmaXyF6wzfAc</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>24292480</pqid></control><display><type>article</type><title>Influence of grain boundaries and surface Debye temperature on the electrical resistance of thin gold films</title><source>American Physical Society Journals</source><creator>VAN ATTEKUM, P. M. T. M ; WOERLEE, P. H ; VERKADE, G. C ; HOEBEN, A. A. M</creator><creatorcontrib>VAN ATTEKUM, P. M. T. M ; WOERLEE, P. H ; VERKADE, G. C ; HOEBEN, A. A. M</creatorcontrib><description>The electrical resistivity of thin Au films deposited on amorphous substrates is found to increase with decreasing film thickness. The temp.-dependent part of the resistivity, however, is independent of the film thickness. This observation cannot be reconciled with existing theories that deal with surface scattering effects. Electron scattering at grain boundaries is shown to explain the measurements. Moreover, the main effect of the surface appears to be a change in the effective Debye temp. 14 ref.--AA</description><identifier>ISSN: 0163-1829</identifier><identifier>EISSN: 1095-3795</identifier><identifier>DOI: 10.1103/physrevb.29.645</identifier><identifier>CODEN: PRBMDO</identifier><language>eng</language><publisher>Woodbury, NY: American Physical Society</publisher><subject>Analysing. Testing. Standards ; Applied sciences ; Condensed matter: electronic structure, electrical, magnetic, and optical properties ; Cross-disciplinary physics: materials science; rheology ; Electrical and thermal conduction in crystalline metals and alloys ; Electronic conduction in metals and alloys ; Electronic transport in condensed matter ; Exact sciences and technology ; Materials science ; Measurement of properties and materials state ; Metals, semimetals and alloys ; Metals. Metallurgy ; Nondestructive testing ; Physics ; Specific materials</subject><ispartof>Physical review. B, Condensed matter, 1984-01, Vol.29 (2), p.645-650</ispartof><rights>1984 INIST-CNRS</rights><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c365t-adad6323bdbc8842b9508a913f98e33b4bd2ccb0ceb08b671add4aa8b66d78cf3</citedby><cites>FETCH-LOGICAL-c365t-adad6323bdbc8842b9508a913f98e33b4bd2ccb0ceb08b671add4aa8b66d78cf3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,2862,2863,27903,27904</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=9704354$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>VAN ATTEKUM, P. M. T. M</creatorcontrib><creatorcontrib>WOERLEE, P. H</creatorcontrib><creatorcontrib>VERKADE, G. C</creatorcontrib><creatorcontrib>HOEBEN, A. A. M</creatorcontrib><title>Influence of grain boundaries and surface Debye temperature on the electrical resistance of thin gold films</title><title>Physical review. B, Condensed matter</title><description>The electrical resistivity of thin Au films deposited on amorphous substrates is found to increase with decreasing film thickness. The temp.-dependent part of the resistivity, however, is independent of the film thickness. This observation cannot be reconciled with existing theories that deal with surface scattering effects. Electron scattering at grain boundaries is shown to explain the measurements. Moreover, the main effect of the surface appears to be a change in the effective Debye temp. 14 ref.--AA</description><subject>Analysing. Testing. Standards</subject><subject>Applied sciences</subject><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties</subject><subject>Cross-disciplinary physics: materials science; rheology</subject><subject>Electrical and thermal conduction in crystalline metals and alloys</subject><subject>Electronic conduction in metals and alloys</subject><subject>Electronic transport in condensed matter</subject><subject>Exact sciences and technology</subject><subject>Materials science</subject><subject>Measurement of properties and materials state</subject><subject>Metals, semimetals and alloys</subject><subject>Metals. Metallurgy</subject><subject>Nondestructive testing</subject><subject>Physics</subject><subject>Specific materials</subject><issn>0163-1829</issn><issn>1095-3795</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1984</creationdate><recordtype>article</recordtype><recordid>eNo9kM1LAzEQxYMoWKtnrzmIt23zsbvdHLV-FQqK6HmZJJN2db9Mdgv97420OJcZmPcevB8h15zNOGdy3m_3weNOz4Sa5Wl2QiacqSyRC5WdkgnjuUx4IdQ5uQjhi8URuZqQ71Xr6hFbg7RzdOOhaqnuxtaCrzBQaC0No3cQ_w-o90gHbHr0MIw-Olo6bJFijWbwlYGaegxVGOAYN2xj2qarLXVV3YRLcuagDnh13FPy-fT4sXxJ1q_Pq-XdOjEyz4YELNhcCqmtNkWRCq0yVoDi0qkCpdSptsIYzQxqVuh8wcHaFCCeuV0UxskpuT3k9r77GTEMZVMFg3UNLXZjKEUqlEgLFoXzg9D4LkR4rux91YDfl5yVf1DLtwj1HXf3pVBlhBodN8doCLGv87FqFf5tasFSmaXyF6wzfAc</recordid><startdate>19840101</startdate><enddate>19840101</enddate><creator>VAN ATTEKUM, P. M. T. M</creator><creator>WOERLEE, P. H</creator><creator>VERKADE, G. C</creator><creator>HOEBEN, A. A. M</creator><general>American Physical Society</general><general>American Institute of Physics</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope></search><sort><creationdate>19840101</creationdate><title>Influence of grain boundaries and surface Debye temperature on the electrical resistance of thin gold films</title><author>VAN ATTEKUM, P. M. T. M ; WOERLEE, P. H ; VERKADE, G. C ; HOEBEN, A. A. M</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c365t-adad6323bdbc8842b9508a913f98e33b4bd2ccb0ceb08b671add4aa8b66d78cf3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1984</creationdate><topic>Analysing. Testing. Standards</topic><topic>Applied sciences</topic><topic>Condensed matter: electronic structure, electrical, magnetic, and optical properties</topic><topic>Cross-disciplinary physics: materials science; rheology</topic><topic>Electrical and thermal conduction in crystalline metals and alloys</topic><topic>Electronic conduction in metals and alloys</topic><topic>Electronic transport in condensed matter</topic><topic>Exact sciences and technology</topic><topic>Materials science</topic><topic>Measurement of properties and materials state</topic><topic>Metals, semimetals and alloys</topic><topic>Metals. Metallurgy</topic><topic>Nondestructive testing</topic><topic>Physics</topic><topic>Specific materials</topic><toplevel>online_resources</toplevel><creatorcontrib>VAN ATTEKUM, P. M. T. M</creatorcontrib><creatorcontrib>WOERLEE, P. H</creatorcontrib><creatorcontrib>VERKADE, G. C</creatorcontrib><creatorcontrib>HOEBEN, A. A. M</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><jtitle>Physical review. B, Condensed matter</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>VAN ATTEKUM, P. M. T. M</au><au>WOERLEE, P. H</au><au>VERKADE, G. C</au><au>HOEBEN, A. A. M</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Influence of grain boundaries and surface Debye temperature on the electrical resistance of thin gold films</atitle><jtitle>Physical review. B, Condensed matter</jtitle><date>1984-01-01</date><risdate>1984</risdate><volume>29</volume><issue>2</issue><spage>645</spage><epage>650</epage><pages>645-650</pages><issn>0163-1829</issn><eissn>1095-3795</eissn><coden>PRBMDO</coden><abstract>The electrical resistivity of thin Au films deposited on amorphous substrates is found to increase with decreasing film thickness. The temp.-dependent part of the resistivity, however, is independent of the film thickness. This observation cannot be reconciled with existing theories that deal with surface scattering effects. Electron scattering at grain boundaries is shown to explain the measurements. Moreover, the main effect of the surface appears to be a change in the effective Debye temp. 14 ref.--AA</abstract><cop>Woodbury, NY</cop><pub>American Physical Society</pub><doi>10.1103/physrevb.29.645</doi><tpages>6</tpages></addata></record> |
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| ispartof | Physical review. B, Condensed matter, 1984-01, Vol.29 (2), p.645-650 |
| issn | 0163-1829 1095-3795 |
| language | eng |
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| source | American Physical Society Journals |
| subjects | Analysing. Testing. Standards Applied sciences Condensed matter: electronic structure, electrical, magnetic, and optical properties Cross-disciplinary physics: materials science rheology Electrical and thermal conduction in crystalline metals and alloys Electronic conduction in metals and alloys Electronic transport in condensed matter Exact sciences and technology Materials science Measurement of properties and materials state Metals, semimetals and alloys Metals. Metallurgy Nondestructive testing Physics Specific materials |
| title | Influence of grain boundaries and surface Debye temperature on the electrical resistance of thin gold films |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-25T02%3A16%3A44IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Influence%20of%20grain%20boundaries%20and%20surface%20Debye%20temperature%20on%20the%20electrical%20resistance%20of%20thin%20gold%20films&rft.jtitle=Physical%20review.%20B,%20Condensed%20matter&rft.au=VAN%20ATTEKUM,%20P.%20M.%20T.%20M&rft.date=1984-01-01&rft.volume=29&rft.issue=2&rft.spage=645&rft.epage=650&rft.pages=645-650&rft.issn=0163-1829&rft.eissn=1095-3795&rft.coden=PRBMDO&rft_id=info:doi/10.1103/physrevb.29.645&rft_dat=%3Cproquest_cross%3E24292480%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=24292480&rft_id=info:pmid/&rfr_iscdi=true |