Grid-based electron–solid interaction simulation for characterizing high-dimensional microstructures

•A new grid-based electron-solid interaction Monte Carlo simulation scheme for high-dimensional structures was developed.•The effect of interfacial diffusion on electrons scattering was investigated by the proposed simulation scheme.•The effect of nanopores and particle-packing structures on electro...

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Veröffentlicht in:	Ultramicroscopy 2020-10, Vol.217, p.113070-113070, Article 113070
Hauptverfasser:	Zhou, Ze Fu, Chen, Shu Jian, Zheng, Chang Xi, Jing, Hong Wen, Duan, Wen Hui
Format:	Artikel
Sprache:	eng
Schlagworte:	Electron–solid interaction simulation High-dimensional microstructure Interfacial diffusion zone Scanning electron microscope Three-dimensional characterization
Online-Zugang:	Volltext
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