Growth of Chromium-Doped GaAs Single Crystals by the Gradient Freeze Method
Chromium-doped GaAs single crystals are grown by a new technique in which the growth rate is initially high and lowered automatically by a preprogramed furnace cooling rate in the conventional gradient freeze method. It is shown that Si and Cr distribution in Cr-doped GaAs single crystals along the...
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Veröffentlicht in: | Journal of applied physics 1984-02, Vol.55 (4), p.1119-1124 |
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creator | Orito, F Tsujikawa, Y Tajima, M |
description | Chromium-doped GaAs single crystals are grown by a new technique in which the growth rate is initially high and lowered automatically by a preprogramed furnace cooling rate in the conventional gradient freeze method. It is shown that Si and Cr distribution in Cr-doped GaAs single crystals along the growth direction depends on crystal growth rate. The effect of growth rate on resistivity and leakage current distribution of Cr-doped GaAs single crystals is also reported. Distribution of deep levels in the crystal grown by the new technique and the relation to impurity distribution are investigated by photoluminescence spectroscopy. 20 ref.--AA |
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fullrecord | <record><control><sourceid>proquest</sourceid><recordid>TN_cdi_proquest_miscellaneous_24227341</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>24227341</sourcerecordid><originalsourceid>FETCH-proquest_miscellaneous_242273413</originalsourceid><addsrcrecordid>eNqNyrsOgjAUANAOmoiPf7iTG0kpJMBoUDAxTrqTKhdbUyj2lhj9eh38AKeznAkLOBdRmOVpPmNzojvnUZTFecAOlbNPr8C2UChnOz124dYO2EAlNwQn3d8MQuFe5KUhuLzAK4TKyUZj76F0iG-EI3plmyWbtt-Eq58Lti5352IfDs4-RiRfd5quaIzs0Y5Ui0SINE6i-O_4AcEkPtI</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>24227341</pqid></control><display><type>article</type><title>Growth of Chromium-Doped GaAs Single Crystals by the Gradient Freeze Method</title><source>AIP Digital Archive</source><creator>Orito, F ; Tsujikawa, Y ; Tajima, M</creator><creatorcontrib>Orito, F ; Tsujikawa, Y ; Tajima, M</creatorcontrib><description>Chromium-doped GaAs single crystals are grown by a new technique in which the growth rate is initially high and lowered automatically by a preprogramed furnace cooling rate in the conventional gradient freeze method. It is shown that Si and Cr distribution in Cr-doped GaAs single crystals along the growth direction depends on crystal growth rate. The effect of growth rate on resistivity and leakage current distribution of Cr-doped GaAs single crystals is also reported. Distribution of deep levels in the crystal grown by the new technique and the relation to impurity distribution are investigated by photoluminescence spectroscopy. 20 ref.--AA</description><identifier>ISSN: 0021-8979</identifier><language>eng</language><ispartof>Journal of applied physics, 1984-02, Vol.55 (4), p.1119-1124</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780</link.rule.ids></links><search><creatorcontrib>Orito, F</creatorcontrib><creatorcontrib>Tsujikawa, Y</creatorcontrib><creatorcontrib>Tajima, M</creatorcontrib><title>Growth of Chromium-Doped GaAs Single Crystals by the Gradient Freeze Method</title><title>Journal of applied physics</title><description>Chromium-doped GaAs single crystals are grown by a new technique in which the growth rate is initially high and lowered automatically by a preprogramed furnace cooling rate in the conventional gradient freeze method. It is shown that Si and Cr distribution in Cr-doped GaAs single crystals along the growth direction depends on crystal growth rate. The effect of growth rate on resistivity and leakage current distribution of Cr-doped GaAs single crystals is also reported. Distribution of deep levels in the crystal grown by the new technique and the relation to impurity distribution are investigated by photoluminescence spectroscopy. 20 ref.--AA</description><issn>0021-8979</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1984</creationdate><recordtype>article</recordtype><recordid>eNqNyrsOgjAUANAOmoiPf7iTG0kpJMBoUDAxTrqTKhdbUyj2lhj9eh38AKeznAkLOBdRmOVpPmNzojvnUZTFecAOlbNPr8C2UChnOz124dYO2EAlNwQn3d8MQuFe5KUhuLzAK4TKyUZj76F0iG-EI3plmyWbtt-Eq58Lti5352IfDs4-RiRfd5quaIzs0Y5Ui0SINE6i-O_4AcEkPtI</recordid><startdate>19840215</startdate><enddate>19840215</enddate><creator>Orito, F</creator><creator>Tsujikawa, Y</creator><creator>Tajima, M</creator><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope></search><sort><creationdate>19840215</creationdate><title>Growth of Chromium-Doped GaAs Single Crystals by the Gradient Freeze Method</title><author>Orito, F ; Tsujikawa, Y ; Tajima, M</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-proquest_miscellaneous_242273413</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1984</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Orito, F</creatorcontrib><creatorcontrib>Tsujikawa, Y</creatorcontrib><creatorcontrib>Tajima, M</creatorcontrib><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><jtitle>Journal of applied physics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Orito, F</au><au>Tsujikawa, Y</au><au>Tajima, M</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Growth of Chromium-Doped GaAs Single Crystals by the Gradient Freeze Method</atitle><jtitle>Journal of applied physics</jtitle><date>1984-02-15</date><risdate>1984</risdate><volume>55</volume><issue>4</issue><spage>1119</spage><epage>1124</epage><pages>1119-1124</pages><issn>0021-8979</issn><abstract>Chromium-doped GaAs single crystals are grown by a new technique in which the growth rate is initially high and lowered automatically by a preprogramed furnace cooling rate in the conventional gradient freeze method. It is shown that Si and Cr distribution in Cr-doped GaAs single crystals along the growth direction depends on crystal growth rate. The effect of growth rate on resistivity and leakage current distribution of Cr-doped GaAs single crystals is also reported. Distribution of deep levels in the crystal grown by the new technique and the relation to impurity distribution are investigated by photoluminescence spectroscopy. 20 ref.--AA</abstract></addata></record> |
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title | Growth of Chromium-Doped GaAs Single Crystals by the Gradient Freeze Method |
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