Fast Pixelated Detectors in Scanning Transmission Electron Microscopy. Part I: Data Acquisition, Live Processing, and Storage

The use of fast pixelated detectors and direct electron detection technology is revolutionizing many aspects of scanning transmission electron microscopy (STEM). The widespread adoption of these new technologies is impeded by the technical challenges associated with them. These include issues relate...

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Veröffentlicht in:	Microscopy and microanalysis 2020-08, Vol.26 (4), p.653-666
Hauptverfasser:	Nord, Magnus, Webster, Robert W. H., Paton, Kirsty A., McVitie, Stephen, McGrouther, Damien, MacLaren, Ian, Paterson, Gary W.
Format:	Artikel
Sprache:	eng
Schlagworte:	Algorithms Computer programs Data acquisition Data processing Detectors Libraries Microscopy New technology Scanning electron microscopy Scanning transmission electron microscopy Sensors Signal processing Software Software and Instrumentation Spectrum analysis Transmission electron microscopy Visualization
Online-Zugang:	Volltext
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