Characterization of microstructural anisotropy in orthotropic materials using a second rank tensor
A second rank symmetric tensor which describes the degree of orientation in orthotropic materials is presented and shown to reflect accurately patterns of experimental data. The use of this tensor to describe microstructural anisotropy is compared to currently accepted methods and is found to be mor...
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| Veröffentlicht in: | Journal of materials science 1984-03, Vol.19 (3), p.761-767 |
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| Hauptverfasser: | , |
| Format: | Artikel |
| Sprache: | eng |
| Online-Zugang: | Volltext |
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