The incorporation of a siliceous impurity during the anodic oxidation of aluminum in a sodium tartrate electrolyte

We have observed the occurrence of a high concentration of silicon as an impurity in thin films of amorphous alumina formed by the anodic oxidation of pure aluminum in a neutral sodium tartrate electrolyte. X-ray absorption analysis of the film by a total secondary electron emission method shows tha...

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Veröffentlicht in:Applications of surface science 1983-01, Vol.17 (1), p.124-130
Hauptverfasser: El-Mashri, S.M., Jones, Robert G., Forty, A.J.
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Sprache:eng
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