Effective Fresnel diffraction field extension of diffractive optical elements with plane wave incidence
Diffractive optical elements (DOEs) are widely used to realize special diffraction fields today, but the size of the effective Fresnel diffraction field of the DOEs with plane wave incidence is limited by the wavelength of the incident beam, sampling interval of the DOE, and distance between the DOE...
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| Veröffentlicht in: | Applied optics (2004) 2020-04, Vol.59 (11), p.3427-3431 |
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| container_issue | 11 |
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| container_title | Applied optics (2004) |
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| creator | Kong, Zhe Xu, Ning Xiao, Huan Tan, Qiaofeng |
| description | Diffractive optical elements (DOEs) are widely used to realize special diffraction fields today, but the size of the effective Fresnel diffraction field of the DOEs with plane wave incidence is limited by the wavelength of the incident beam, sampling interval of the DOE, and distance between the DOE and the output plane. In this paper, a method is proposed to extend the size of the effective Fresnel diffraction field with an introduced intermediate plane and two-step diffraction calculation. Zero padding is used on the DOE plane, the sampling interval on the intermediate plane is correspondingly decreased, and the size of the Fresnel diffraction field on the output plane is finally extended. The accompanying aliasing is eliminated by placing a low-pass filter on the intermediate plane. Both numerical simulations and experimental results show the validity of the proposed method to extend the size of the effective Fresnel diffraction field of the DOEs with plane wave incidence. |
| doi_str_mv | 10.1364/AO.387646 |
| format | Article |
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In this paper, a method is proposed to extend the size of the effective Fresnel diffraction field with an introduced intermediate plane and two-step diffraction calculation. Zero padding is used on the DOE plane, the sampling interval on the intermediate plane is correspondingly decreased, and the size of the Fresnel diffraction field on the output plane is finally extended. The accompanying aliasing is eliminated by placing a low-pass filter on the intermediate plane. 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In this paper, a method is proposed to extend the size of the effective Fresnel diffraction field with an introduced intermediate plane and two-step diffraction calculation. Zero padding is used on the DOE plane, the sampling interval on the intermediate plane is correspondingly decreased, and the size of the Fresnel diffraction field on the output plane is finally extended. The accompanying aliasing is eliminated by placing a low-pass filter on the intermediate plane. Both numerical simulations and experimental results show the validity of the proposed method to extend the size of the effective Fresnel diffraction field of the DOEs with plane wave incidence.</description><subject>Aliasing</subject><subject>Computer simulation</subject><subject>Diffractive optical elements</subject><subject>Fresnel diffraction</subject><subject>Low pass filters</subject><subject>Optical components</subject><subject>Plane waves</subject><subject>Sampling</subject><subject>Wave diffraction</subject><issn>1559-128X</issn><issn>2155-3165</issn><issn>1539-4522</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2020</creationdate><recordtype>article</recordtype><recordid>eNpdkD1PwzAQhi0EoqUw8AdQJBYYArbPdu2xqiggIXVhYItc5wyu0qTECYV_j6sWkJju67lXdy8h54zeMFDidjK_AT1WQh2QIWdS5sCUPCTDlJqccf0yICcxLikFKcz4mAyAC0qFHA_J65336LrwgdmsxVhjlZXB-9amXlNnPmBVZvjZYR23deP_xmmlWXfB2SrDCldYdzHbhO4tW1e2xmxjExBqF0qsHZ6SI2-riGf7OCLPs7vn6UP-NL9_nE6ecgcMutwAZVILKSRDxg2WTClw1DNtLVDrF8opsQDmhQLU1BmuNTdaCEMVlAgjcrWTXbfNe4-xK1YhOqy2FzV9LNLfXIChVCf08h-6bPq2TscVHLThXI4pJOp6R7m2ibFFX6zbsLLtV8FosTW_mMyLnfmJvdgr9osVlr_kj9vwDb7ZfgQ</recordid><startdate>20200410</startdate><enddate>20200410</enddate><creator>Kong, Zhe</creator><creator>Xu, Ning</creator><creator>Xiao, Huan</creator><creator>Tan, Qiaofeng</creator><general>Optical Society of America</general><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope><scope>7X8</scope><orcidid>https://orcid.org/0000-0001-7419-319X</orcidid></search><sort><creationdate>20200410</creationdate><title>Effective Fresnel diffraction field extension of diffractive optical elements with plane wave incidence</title><author>Kong, Zhe ; Xu, Ning ; Xiao, Huan ; Tan, Qiaofeng</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c313t-93015845451e129ed1663c0f18aa30afb6c64b31f463e80c9288298449063de3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2020</creationdate><topic>Aliasing</topic><topic>Computer simulation</topic><topic>Diffractive optical elements</topic><topic>Fresnel diffraction</topic><topic>Low pass filters</topic><topic>Optical components</topic><topic>Plane waves</topic><topic>Sampling</topic><topic>Wave diffraction</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Kong, Zhe</creatorcontrib><creatorcontrib>Xu, Ning</creatorcontrib><creatorcontrib>Xiao, Huan</creatorcontrib><creatorcontrib>Tan, Qiaofeng</creatorcontrib><collection>PubMed</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>MEDLINE - Academic</collection><jtitle>Applied optics (2004)</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Kong, Zhe</au><au>Xu, Ning</au><au>Xiao, Huan</au><au>Tan, Qiaofeng</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Effective Fresnel diffraction field extension of diffractive optical elements with plane wave incidence</atitle><jtitle>Applied optics (2004)</jtitle><addtitle>Appl Opt</addtitle><date>2020-04-10</date><risdate>2020</risdate><volume>59</volume><issue>11</issue><spage>3427</spage><epage>3431</epage><pages>3427-3431</pages><issn>1559-128X</issn><eissn>2155-3165</eissn><eissn>1539-4522</eissn><abstract>Diffractive optical elements (DOEs) are widely used to realize special diffraction fields today, but the size of the effective Fresnel diffraction field of the DOEs with plane wave incidence is limited by the wavelength of the incident beam, sampling interval of the DOE, and distance between the DOE and the output plane. In this paper, a method is proposed to extend the size of the effective Fresnel diffraction field with an introduced intermediate plane and two-step diffraction calculation. Zero padding is used on the DOE plane, the sampling interval on the intermediate plane is correspondingly decreased, and the size of the Fresnel diffraction field on the output plane is finally extended. The accompanying aliasing is eliminated by placing a low-pass filter on the intermediate plane. Both numerical simulations and experimental results show the validity of the proposed method to extend the size of the effective Fresnel diffraction field of the DOEs with plane wave incidence.</abstract><cop>United States</cop><pub>Optical Society of America</pub><pmid>32400457</pmid><doi>10.1364/AO.387646</doi><tpages>5</tpages><orcidid>https://orcid.org/0000-0001-7419-319X</orcidid></addata></record> |
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| identifier | ISSN: 1559-128X |
| ispartof | Applied optics (2004), 2020-04, Vol.59 (11), p.3427-3431 |
| issn | 1559-128X 2155-3165 1539-4522 |
| language | eng |
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| source | Alma/SFX Local Collection; Optica Publishing Group Journals |
| subjects | Aliasing Computer simulation Diffractive optical elements Fresnel diffraction Low pass filters Optical components Plane waves Sampling Wave diffraction |
| title | Effective Fresnel diffraction field extension of diffractive optical elements with plane wave incidence |
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