Assessment of wheat grain texture by near infrared reflectance measurements on Buhler-milled flour

A calibration is presented between near infrared (n.i.r.) reflectance data at 1720 and 1288 nm and wheat grain kernel texture as determined by air‐jet sieving on flour Bühler‐milled from home‐grown wheat. A multiple correlation of 0.996 and a residual standard deviation of 0.140 was achieved with a...

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Veröffentlicht in:Journal of the science of food and agriculture 1981-02, Vol.32 (2), p.200-202
Hauptverfasser: Osborne, B.G, Douglas, S, Fearn, T
Format: Artikel
Sprache:eng
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