Assessment of wheat grain texture by near infrared reflectance measurements on Buhler-milled flour
A calibration is presented between near infrared (n.i.r.) reflectance data at 1720 and 1288 nm and wheat grain kernel texture as determined by air‐jet sieving on flour Bühler‐milled from home‐grown wheat. A multiple correlation of 0.996 and a residual standard deviation of 0.140 was achieved with a...
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Veröffentlicht in: | Journal of the science of food and agriculture 1981-02, Vol.32 (2), p.200-202 |
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