Diffusion and structural relaxation in compositionally modulated amorphous metal films
The interdiffusivity in compositionally modulated (λ≈25 Å) amorphous (Pd85Si15)61/(Fe85B15)89 and (Pd80Au7Si13)70/Fe30 films has been measured by monitoring the satellite of the (000) x-ray scattering peak during isothermal anneals in the range 210–250 °C. Diffusivities as low as 10−22 cm2 s−1 have...
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| Veröffentlicht in: | Applied physics letters 1980-07, Vol.37 (2), p.184-186 |
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| container_title | Applied physics letters |
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| creator | Rosenblum, M. P. Spaepen, F. Turnbull, D. |
| description | The interdiffusivity in compositionally modulated (λ≈25 Å) amorphous (Pd85Si15)61/(Fe85B15)89 and (Pd80Au7Si13)70/Fe30 films has been measured by monitoring the satellite of the (000) x-ray scattering peak during isothermal anneals in the range 210–250 °C. Diffusivities as low as 10−22 cm2 s−1 have been measured. It was observed that the diffusivity decreased continuously during the annealing as a result of structural relaxation and settled down to a constant value only after many hours of annealing. The activation energy of the isoconfigurational diffusivity in the Pd-Au-Si/Fe films is 167 kJ mol−1. This value and the time scale of the relaxation are similar to those observed in earlier viscosity measurements, indicating a similarity between the structural defects controlling both transport processes. |
| doi_str_mv | 10.1063/1.91818 |
| format | Article |
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P.</creatorcontrib><creatorcontrib>Spaepen, F.</creatorcontrib><creatorcontrib>Turnbull, D.</creatorcontrib><collection>CrossRef</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><jtitle>Applied physics letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Rosenblum, M. P.</au><au>Spaepen, F.</au><au>Turnbull, D.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Diffusion and structural relaxation in compositionally modulated amorphous metal films</atitle><jtitle>Applied physics letters</jtitle><date>1980-07-15</date><risdate>1980</risdate><volume>37</volume><issue>2</issue><spage>184</spage><epage>186</epage><pages>184-186</pages><issn>0003-6951</issn><eissn>1077-3118</eissn><abstract>The interdiffusivity in compositionally modulated (λ≈25 Å) amorphous (Pd85Si15)61/(Fe85B15)89 and (Pd80Au7Si13)70/Fe30 films has been measured by monitoring the satellite of the (000) x-ray scattering peak during isothermal anneals in the range 210–250 °C. Diffusivities as low as 10−22 cm2 s−1 have been measured. It was observed that the diffusivity decreased continuously during the annealing as a result of structural relaxation and settled down to a constant value only after many hours of annealing. The activation energy of the isoconfigurational diffusivity in the Pd-Au-Si/Fe films is 167 kJ mol−1. This value and the time scale of the relaxation are similar to those observed in earlier viscosity measurements, indicating a similarity between the structural defects controlling both transport processes.</abstract><doi>10.1063/1.91818</doi><tpages>3</tpages></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0003-6951 |
| ispartof | Applied physics letters, 1980-07, Vol.37 (2), p.184-186 |
| issn | 0003-6951 1077-3118 |
| language | eng |
| recordid | cdi_proquest_miscellaneous_23696311 |
| source | AIP Digital Archive |
| title | Diffusion and structural relaxation in compositionally modulated amorphous metal films |
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