Electromigration in aluminum conductors which are chains of single crystals

Electromigration was investigated in 1×4×250 μm aluminum conductors which were recrystallized to produce chains of single-crystal grains, ’’bamboo’’ structures. Median lifetimes were substantially longer than are found in normal polycrystalline Al, reflecting the lack of grain boundary diffusion pat...

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Veröffentlicht in:	Applied physics letters 1981-01, Vol.39 (2), p.165-168
Hauptverfasser:	Pierce, J. M., Thomas, M. E.
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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