Absorption Effects in STEM Microanalysis of Ceramic Oxides

Absorption Effects in STEM Microanalysis of Ceramic Oxides

A scanning transmission electron microscope (STEM) equipped with an X‐ray energy dispersive spectrometer (EDS) was used for quantitative X‐ray tnicroanalysis of an MgO‐10 mol% NiO ceramic. Using the Cliff‐Lorimer standardless ratio technique for quantitative X‐ray microanalysis, absorption of the Mg...

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Veröffentlicht in:Journal of the American Ceramic Society 1980-01, Vol.63 (3-4), p.149-151
Hauptverfasser: BENDER, B. A., WILLIAMS, D. B., NOTIS, M. R.
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container_title Journal of the American Ceramic Society
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creator BENDER, B. A.
WILLIAMS, D. B.
NOTIS, M. R.
description A scanning transmission electron microscope (STEM) equipped with an X‐ray energy dispersive spectrometer (EDS) was used for quantitative X‐ray tnicroanalysis of an MgO‐10 mol% NiO ceramic. Using the Cliff‐Lorimer standardless ratio technique for quantitative X‐ray microanalysis, absorption of the Mg characteristic X rays, particularly by oxygen in the specimen, was found to be a critical problem and corrections were required. This problem is characteristic of low atomic number oxide ceramics. However, preferential absorption of characteristic X rays by carbon contamination buildup during X‐ray analysis was negligible. A grain‐boundary composition profile, corrected for absorption, showed no segregation of the Ni to the grain boundary, in agreement with current segregation theory.
doi_str_mv 10.1111/j.1151-2916.1980.tb10680.x
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title Absorption Effects in STEM Microanalysis of Ceramic Oxides
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