Detection of ionizing radiation by charge storage in shallow levels in semiconductors at cryogenic temperatures
At cryogenic temperatures, ionized impurities act as traps with large capture cross sections. Phosphorus ions in the i-region of a p-i-n diode at 4.2K have been used to trap carriers produced by the passage of Compton electrons and 40 GeV pions. The p-i-n diode acts as a detector and a memory elemen...
Gespeichert in:
Veröffentlicht in: | IEEE transactions on nuclear science 1982-01, Vol.NS-29 (1), p.728-732 |
---|---|
Hauptverfasser: | , , , , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Schreiben Sie den ersten Kommentar!